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VSC7217UC датащи(PDF) 23 Page - Vitesse Semiconductor Corporation |
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VSC7217UC датащи(HTML) 23 Page - Vitesse Semiconductor Corporation |
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23 / 36 page ![]() © VITESSE SEMICONDUCTOR CORPORATION Page 23 6/14/00 741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896 VITESSE SEMICONDUCTOR CORPORATION Preliminary Datasheet VSC7217 Multi-Gigabit Interconnect Chip G52325-0, Rev. 3.0 Figure 19: RCLKn and RCLKNn Timing Waveforms with DUAL = 1 Table 14: General Receive AC Characteristics NOTE: (1) The probability of correct data acquisition and recovery is 99% per FC-PH 4.3 Section 5.3. Parameters Description Min. Max. Units Conditions T3 Delay Between Rising Edge of RCLKn to Rising Edge of RCLKNn 10 x TRX -500 10 x TRX +500 ps TRX is the bit period of the incoming data on Rx. ∆T3 RCLKn to RCLKNn Skew -500 500 ps Deviation of RCLKn rising edge to RCLKNn rising edge. Nominal delay is 10 bit times. T4 Period of RCLKn and RCLKNn 0.99 x TREFCLK 1.01 x TREFCLK ps Whether or not locked to serial data, independent of DUAL input. ∆T4 Deviation of RCLK/RCLKN Period from REFCLK Period -1.0 1.0 % Whether or not locked to serial data, independent of DUAL input. TR, TF Output Rise and Fall Time — 2.4 ns Between VIL(MAX) and VIH(MIN) into 10pf load. RLAT Latency from RX0 to REFCLK or RCLK 70.5bc-1.6ns 48.5bc-1.6ns 81.5bc+4.1ns 102.5bc+4.1ns bc+ns ENDEC=1, Recenter only ENDEC=X, Recenter + Drift TLOCK(1) Data Acquisition Lock Time — 100 bc Using K28.5+/K28.5- pattern. tested on a sample basis. TJTD Receive Data Total Jitter Tolerance (p-p) 600 ps IEEE 802.3z Clause 38.68, tested on a sample basis. DJTD Receive Data Deterministic Jitter Tolerance (p-p) 370 ps IEEE 802.3z Clause 38.69, tested on a sample basis. RCLKNn RCLKn T4 T3 Delay 10 fbaud ------------ ∆T3 ± = TRCLK TREFCLK ∆T4 ± = |
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