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MAX17843 датащи(PDF) 82 Page - Maxim Integrated Products |
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MAX17843 датащи(HTML) 82 Page - Maxim Integrated Products |
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82 / 131 page ![]() Cell Undervoltage Diagnostic Turning on the balancing switch can be used to generate a near-zero voltage at any input channel to the ALTMUX path. By successfully measuring this near-zero voltage, the diagnostic verifies the lower-end of the input range and the undervoltage alert function. Input range can also be verified by using the cell-test sources to induce a lower cell-channel voltage. If the change is as expected, it shows that the system can mea- sure voltages below the present nominal input voltage. ALRTHVUV Comparator Diagnostic The ALRTHVUV comparator functionality can be verified by setting the CPEN bit (to disable the HV charge pump) and then discharging the external HV capacitor by performing an acquisition for 5ms (such as 12 cells, 32 oversamples), or by enabling using one or more of the cell-test current sources for an appropriate amount of time. The ALRTHVUV bit should be set after the voltage has decayed. HVMUX Sequencer Diagnostic The HVMUX control sequence can be checked using the sources attached to the Cn pins. The sources are con- trolled by the CTSTEN bits of the CTSTCFG register. The basic test method is as follows: 1) Perform an acquisition 2) Turn on a cell-test source 3) Wait for sufficient settling time 4) Perform an acquisition 5) Check that the cell(s) sharing the pin whose current source was turned on had the expected measure- ment change and other cells had no changes. 6) Repeat steps 1–5 for other pins to confirm there are no logic errors in the HVMUX control sequencer. The cell-test sources can be turned on for individual pins to create a detectable measurement variation that is deter- mined by the current-source value and the series resis- tance of the cell input-filter circuit. The settling time needed for a certain change in measurement value depends on the size of the external filter capacitors and the amplitude of the test-current source. A longer settling time gives the full voltage change, while a shorter settling time saves test time and should still produce an easily detectable voltage difference. By detecting the expected measurement varia- tion for a given cell input pair and running a sequence of tests to cover all cases, the HVMUX sequencer operation is verified. Figure 53. HVMUX Sequencer Diagnostic Cn-1 Cn RFILTER RHVMUX CELL n + - LSAMP TO ADC VAA AGND TEST SOURCE AGND AGND TEST SOURCES CONTROLLED BY: CTSTENn CTSTSRC CTSTDAC RHVMUX VAA AGND RFILTER TEST SOURCE MAX17843 12-Channel, High-Voltage Smart Sensor Data-Acquisition Interface www.maximintegrated.com Maxim Integrated │ 82 |
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