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INA239 датащи(PDF) 30 Page - Texas Instruments |
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INA239 датащи(HTML) 30 Page - Texas Instruments |
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30 / 44 page ![]() Table 8-2. INA239 Noise Performance (continued) ADC CONVERSION TIME PERIOD [µs] OUTPUT SAMPLE AVERAGING [SAMPLES] OUTPUT SAMPLE PERIOD [ms] NOISE-FREE ENOB (±163.84-mV) (ADCRANGE = 0) NOISE-FREE ENOB (±40.96-mV) (ADCRANGE = 1) 50 256 12.8 15.7 13.7 84 21.504 15.7 14.7 150 38.4 15.7 15.7 280 71.68 16.0 15.7 540 138.24 16.0 15.7 1052 269.312 16.0 16.0 2074 530.944 16.0 16.0 4120 1054.72 16.0 16.0 50 512 25.6 15.7 14.1 84 43 16.0 15.7 150 76.8 16.0 15.7 280 143.36 16.0 15.7 540 276.48 16.0 15.7 1052 538.624 16.0 16.0 2074 1061.888 16.0 16.0 4120 2109.44 16.0 16.0 50 1024 51.2 15.7 14.7 84 86.016 15.7 15.7 150 153.6 16.0 16.0 280 286.72 16.0 16.0 540 552.96 16.0 16.0 1052 1077.248 16.0 16.0 2074 2123.776 16.0 16.0 4120 4218.88 16.0 16.0 8.1.4 Input Filtering Considerations As previously discussed, INA239 offers several options for noise filtering by allowing the user to select the conversion times and number of averages independently in the ADC_CONFIG register. The conversion times can be set independently for the shunt voltage and bus voltage measurements to allow added flexibility in monitoring of the power-supply bus. The internal ADC has good inherent noise rejection; however, the transients that occur at or very close to the sampling rate harmonics can cause problems. Because these signals are at 1 MHz and higher, they can be managed by incorporating filtering at the input of the device. Filtering high frequency signals enables the use of low-value series resistors on the filter with negligible effects on measurement accuracy. For best results, filter using the lowest possible series resistance (typically 100 Ω or less) and a ceramic capacitor. Recommended values for this capacitor are between 0.1 µF and 1 µF. Figure 8-1 shows the device with a filter added at the input. Overload conditions are another consideration for the device inputs. The device inputs are specified to tolerate ±40 V differential across the IN+ and IN– pins. A large differential scenario might be a short to ground on the load side of the shunt. This type of event can result in full power-supply voltage across the shunt (as long the power supply or energy storage capacitors support it). Removing a short to ground can result in inductive kickbacks that could exceed the 40-V differential or 85-V common-mode absolute maximum rating of the device. Inductive kickback voltages are best controlled by Zener-type transient-absorbing devices (commonly called transzorbs) combined with sufficient energy storage capacitance. See the Transient Robustness for Current Shunt Monitors reference design which describes a high-side current shunt monitor used to measure the voltage developed across a current-sensing resistor when current passes through it. INA239 SLYS027 – JANUARY 2021 www.ti.com 30 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA239 |
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