GD9FS1G8F2AMG datasheet(53/55 Pages) GIGADEVICE

53 / 55 page

SLC NAND FLASH

GD9Fx1GxF2A

15. Revision History

Version No.

History Description

Date

1.0

Update parameter page value

Update package FBGA-63 information

2016-6-2

1.1

Change page size from 2K+64 to 2K+128

2016-7-12

1.2

Add CRC value in parameter page

Remove tFEAT parameter

Change Device resetting time for read from 5us to 10us

Change Device resetting time for read from 10us to 20us

Add parameter page CRC value table

2016-11-01

1.3

Add parameter page CRC arithmetic related description

Update CRC table value

Update Package information according Package vendor final file.

2016-11-15

1.4

Update R/B# Resistance figure with Trise and Tfall

Update some figure with RD review.

2016-12-14

1.5

Update Part Numbering Information

Add F code at

field “Temperature Grade” for Full Function Test for Automotive

application and No AECQ

2017-02-27

1.6

Remove last three code from part number

2017-06-26

1.7

Change VOL Max. from 0.1 to 0.4

Change ISB Max. from 30 to 50

Change IOL(R/B#) test condition VOL from 0.4V to 0.45V

Change description with “The addressing must be done in sequential order in a block”

for page program

2017-10-31

1.8

Add a note of P/E cycles with ECC

Delete Commercial Temperature Grade. And add Industrial(J) (-40C ~ 105C)

Temperature Grade

2017-11-14

1.9

Change P/E cycles with ECC from 50k to 100k, and delete note.

Delete Industrial+(F):-40C~85C

2017-11-27

2.0

Change Operating Current Standby (Max.) from 30uA to 50uA

Change VOH min from VCC-0.1 to VCC-0.3V

Change Parameter page table Byte 105-106 ,108-109,and change CRC Value

Change 1.8V tWP and tRP from 12 to 22, Change 1.8V tWH and tREH from 10 to 15

Change tCBSYW and tCBSYR from 3us to 5us

Add the figure for Read Unique ID Timing.

2018-4-4

2.1

Update the tf and tr value in Figure26 :Ready/Busy figures

Modify the typo of reliability of program/erase cycles with ECC in chapter 2

Add part numbers of GD9FU1G6F2AMG and GD9FS1G6F2AMG in chapter2.1

2018-5-2

2.2

Modify the description of Write Protect

Add the chapter of 5.3 Factory Defect Mapping

2018-5-17

2.3

Modify the description of Common Page Program command

Modify the sequence diagram of Cache Program Operation command (figure 19)

2018-9-3

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