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AD5231 датащи(PDF) 17 Page - Analog Devices

номер детали AD5231
подробное описание детали  Nonvolatile Memory, 1024-Position Digital Potentiometers
PDF  24 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
Logo AD - Analog Devices

AD5231 датащи(HTML) 17 Page - Analog Devices

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AD5231
–17–
Table XV. Reading Back Wiper Settings
SDI
SDO
Action
B00200H
XXXXXXH
Sets RDAC to midscale.
C0XXXXH B00200H
Doubles RDAC from midscale to
full-scale. (Left shift instructions)
A0XXXXH C0XXXXH
Prepares reading wiper setting from
RDAC register.
XXXXXXH A003FFH
Readback full-scale value from
RDAC register.
TEST CIRCUITS
Figures 11 to 19 define the test conditions used in the product
specifications table.
A
W
B
NC
IW
DUT
VMS
NC = NO CONNECT
Figure 11. Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
A
W
B
DUT
VMS
V+
V+ = V DD
1LSB = V+/2N
Figure 12. Potentiometer Divider Nonlinearity Error Test
Circuit (INL, DNL)
A
W
B
DUT
IW
VMS1
VMS2
VW
RW = [VMS1 – V MS2]/IW
Figure 13. Wiper Resistance Test Circuit
A
W
B
VMS
V+ = V DD
10%
PSRR (dB) = 20 LOG
VMS
VDD
(
)
~
VA
VDD
VMS%
VDD%
PSS (%/%) =
V+
Figure 14. Power Supply Sensitivity Test Circuit
(PSS, PSRR)
OFFSET BIAS
OFFSET
GND
AB
DUT
W
5V
VIN
VOUT
OP279
Figure 15. Inverting Gain Test Circuit
OFFSET BIAS
OFFSET
GND
AB
DUT
W
5V
VIN
VOUT
OP279
Figure 16. Noninverting Gain Test Circuit
OFFSET
GND
A
B
DUT
W
+15V
VIN
VOUT
OP42
–15V
2.5V
Figure 17. Gain vs. Frequency Test Circuit
+
_
DUT
CODE =
H
0.1V
VBIAS
RSW =
0.1V
ISW
ISW
W
B
A = NC
Figure 18. Incremental ON Resistance Test Circuit
DUT
VSS
ICM
W
B
VDD
NC
NC
VCM
GND
A
NC = NO CONNECT
Figure 19. Common-Mode Leakage Current Test Circuit



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