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AFT05MP075N датащи(PDF) 2 Page - NXP Semiconductors |
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AFT05MP075N датащи(HTML) 2 Page - NXP Semiconductors |
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2 / 21 page ![]() 2 RF Device Data Freescale Semiconductor, Inc. AFT05MP075NR1 AFT05MP075GNR1 Table 1. Maximum Ratings Rating Symbol Value Unit Drain--Source Voltage VDSS --0.5, +40 Vdc Gate--Source Voltage VGS --6.0, +12 Vdc Operating Voltage VDD 17, +0 Vdc Storage Temperature Range Tstg --65 to +150 C Case Operating Temperature Range TC –40 to +150 C Operating Junction Temperature Range (1,2) TJ –40 to +225 C Total Device Dissipation @ TC =25C Derate above 25C PD 690 3.45 W W/C Table 2. Thermal Characteristics Characteristic Symbol Value (2,3) Unit Thermal Resistance, Junction to Case Case Temperature 80C, 70 W CW, 12.5 Vdc, IDQ(A+B) = 400 mA, 520 MHz RJC 0.29 C/W Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2, passes 2500 V Machine Model (per EIA/JESD22--A115) A, passes 250 V Charge Device Model (per JESD22--C101) IV, passes 2000 V Table 4. Moisture Sensitivity Level Test Methodology Rating Package Peak Temperature Unit Per JESD22--A113, IPC/JEDEC J--STD--020 3 260 C Table 5. Electrical Characteristics (TA =25C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS =40 Vdc, VGS =0 Vdc) IDSS — — 3 Adc Zero Gate Voltage Drain Leakage Current (VDS = 12.5 Vdc, VGS =0 Vdc) IDSS — — 2 Adc Gate--Source Leakage Current (VGS =5 Vdc, VDS =0 Vdc) IGSS — — 600 nAdc On Characteristics Gate Threshold Voltage (VDS =10 Vdc, ID = 295 Adc) VGS(th) 1.7 2.1 2.5 Vdc Drain--Source On--Voltage (VGS =10 Vdc, ID =3.0 Adc) VDS(on) — 0.14 — Vdc Forward Transconductance (4) (VGS =10 Vdc, ID =8 Adc) gfs — 7.3 — S 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 4. Each side of device measured separately. (continued) |
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