 |
поискавой системы для электроныых деталей |
|
|
поискавой системы для электроныых деталей |
|
PC7447 датащи(PDF) 37 Page - ATMEL Corporation |
|
|
|||||||||||||||||||||||||||||
PC7447 датащи(HTML) 37 Page - ATMEL Corporation |
|
|
37 / 66 page  37 PC7457/47 [Preliminary] 5345B–HIREL–02/04 Figure 22. Test Access Port Timing Diagram Note: VM = Midpoint Voltage (OVDD/2) Preparation for Delivery Handling MOS devices must be handled with certain precautions to avoid damage due to accu- mulation of static charge. Input protection devices have been designed in the chip to minimize the effect of static buildup. However, the following handling practices are recommended: • Devices should be handled on benches with conductive and grounded surfaces. • Ground test equipment, tools and operator. • Do not handle devices by the leads. • Store devices in conductive foam or carriers. • Avoid use of plastic, rubber or silk in MOS areas. • Maintain relative humidity above 50% if practical. tJLOX Input Data Valid tIVJH tIXJH tJLOV tJLOZ Output Data Valid Output Data Valid VM TCK TDI, TMS TDO TDO VM |
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Russian ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
