AM3351 datasheet(80/252 Pages) TI1

80 / 252 page

AM3359, AM3358, AM3357, AM3356, AM3354, AM3352, AM3351

SPRS717J – OCTOBER 2011 – REVISED APRIL 2016

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Specifications

Absolute Maximum Ratings (continued)

over junction temperature range (unless otherwise noted)(1)(2)

respective I/O supply. It is important the attached peripheral never sources a voltage outside the valid input voltage range, including

power supply ramp-up and ramp-down sequences.

(9) This terminal is connected to analog circuits in the respective USB PHY. The circuit sources a known current while measuring the

voltage to determine if the terminal is connected to VSSA_USB with a resistance less than 10 Ω or greater than 100 kΩ. The terminal

should be connected to ground for USB host operation or open-circuit for USB peripheral operation, and should never be connected to

any external voltage source.

(10) Based on JEDEC JESD78D [IC Latch-Up Test].

(11) For tape and reel the storage temperature range is [–10°C; +50°C] with a maximum relative humidity of 70%. TI recommends returning

to ambient room temperature before usage.

Fail-safe I/O terminals are designed such they do not have dependencies on the respective I/O power supply voltage. This allows

external voltage sources to be connected to these I/O terminals when the respective I/O power supplies are turned off. The USB0_VBUS

and USB1_VBUS are the only fail-safe I/O terminals. All other I/O terminals are not fail-safe and the voltage applied to them should be

limited to the value defined by the steady state max. Voltage at all I/O pins parameter in Section 5.1.

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

5.2

ESD Ratings

VALUE

UNIT

VESD

Electrostatic discharge

(ESD) performance:

Human Body Model (HBM), per ANSI/ESDA/JEDEC JS001(1)

±2000

Charged Device Model (CDM), per JESD22-C101(2)

±500

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