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MIC280 датащи(PDF) 4 Page - Micrel Semiconductor

номер детали MIC280
подробное описание детали  Precision IttyBitty Thermal Supervisor
PDF  23 Pages
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производитель  MICREL [Micrel Semiconductor]
домашняя страница  http://www.micrel.com
Logo MICREL - Micrel Semiconductor

MIC280 датащи(HTML) 4 Page - Micrel Semiconductor

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MIC280
Micrel
MIC280
4
November 2004
Symbol
Parameter
Condition
Min
Typ
Max
Units
Serial Data I/O Pin, DATA
VOL
Low Output Voltage, Note 4
IOL = 3mA
0.3
V
IOL = 6mA
0.5
V
VIL
Low Input Voltage
3V ≤ VDD ≤ 3.6V
0.8
V
VIH
High Input Voltage
3V ≤ VDD ≤ 3.6V
2.1
5.5
V
CIN
Input Capacitance
Note 5
10
pF
ILEAK
Input Current
±1
µ
A
Serial Clock Input, CLK
VIL
Low Input Voltage
3V ≤ VDD ≤ 3.6V
0.8
V
VIH
High Input Voltage
3V ≤ VDD ≤ 3.6V
2.1
5.5
V
CIN
Input Capacitance
Note 5
10
pF
ILEAK
Input Current
±1
µ
A
Interrupt Output, /INT
VOL
Low Output Voltage, Note 4
IOL = 3mA
0.3
V
IOL = 6mA
0.5
V
tINT
Interrupt Propagation Delay
from TEMPx < TLOWx or
[tCONV]
ms
Notes 5, 6
TEMPx > THIGHx or TEMPx >
CRITx to /INT < VOL; RPULLUP = 10kΩ
tnINT
Interrupt Reset Propagation Delay
from read of STATUS or A.R.A. to
1
µ
s
Note 5, 9
/INT > VOH; RPULLUP = 10kΩ
ILEAK
±1
µ
A
Serial Interface Timing
t1
CLK (Clock) Period
2.5
µs
t2
Data In Setup Time to CLK High
100
ns
t3
Data Out Stable after CLK Low
300
ns
t4
Data Low Setup Time to CLK Low
Start Condition
100
ns
t5
Data High Hold Time after CLK
Stop Condition
100
ns
High
tTO
Bus Timeout
25
30
35
ms
Note 1. Exceeding the absolute maximum rating may damage the device.
Note 2. The device is not guaranteed to function outside its operating range. Final test on outgoing product is performed at TA = 25°C.
Note 3. Devices are ESD sensitive. Handling precautions recommended.
Note 4. Current into the /INT or DATA pins will result in self heating of the device. Sink current should be minimized for best accuracy.
Note 5. Guaranteed by design over the operating temperature range. Not 100% production tested.
Note 6. tINT and tCRIT are equal to tCONV.
Note 7. TD is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 8.
Note 8. tCONV = tCONV(local) + tCONV(remote). Following the acquisition of either remote or local temperature data, the limit comparisons for that zone
are performed and the device status updated; Status bits will be set and /INT driven active, if applicable.
Note 9. The interrupt reset propogation delay is dominated by the capacitance on the bus.
Note 10. Accuracy specification does not include quantization noise, which may be up to ±1/2 LSB.
Note 11. Tested at 10-bit resolution.



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