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MIC280 датащи(PDF) 4 Page - Micrel Semiconductor |
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MIC280 датащи(HTML) 4 Page - Micrel Semiconductor |
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4 / 23 page ![]() MIC280 Micrel MIC280 4 November 2004 Symbol Parameter Condition Min Typ Max Units Serial Data I/O Pin, DATA VOL Low Output Voltage, Note 4 IOL = 3mA 0.3 V IOL = 6mA 0.5 V VIL Low Input Voltage 3V ≤ VDD ≤ 3.6V 0.8 V VIH High Input Voltage 3V ≤ VDD ≤ 3.6V 2.1 5.5 V CIN Input Capacitance Note 5 10 pF ILEAK Input Current ±1 µ A Serial Clock Input, CLK VIL Low Input Voltage 3V ≤ VDD ≤ 3.6V 0.8 V VIH High Input Voltage 3V ≤ VDD ≤ 3.6V 2.1 5.5 V CIN Input Capacitance Note 5 10 pF ILEAK Input Current ±1 µ A Interrupt Output, /INT VOL Low Output Voltage, Note 4 IOL = 3mA 0.3 V IOL = 6mA 0.5 V tINT Interrupt Propagation Delay from TEMPx < TLOWx or [tCONV] ms Notes 5, 6 TEMPx > THIGHx or TEMPx > CRITx to /INT < VOL; RPULLUP = 10kΩ tnINT Interrupt Reset Propagation Delay from read of STATUS or A.R.A. to 1 µ s Note 5, 9 /INT > VOH; RPULLUP = 10kΩ ILEAK ±1 µ A Serial Interface Timing t1 CLK (Clock) Period 2.5 µs t2 Data In Setup Time to CLK High 100 ns t3 Data Out Stable after CLK Low 300 ns t4 Data Low Setup Time to CLK Low Start Condition 100 ns t5 Data High Hold Time after CLK Stop Condition 100 ns High tTO Bus Timeout 25 30 35 ms Note 1. Exceeding the absolute maximum rating may damage the device. Note 2. The device is not guaranteed to function outside its operating range. Final test on outgoing product is performed at TA = 25°C. Note 3. Devices are ESD sensitive. Handling precautions recommended. Note 4. Current into the /INT or DATA pins will result in self heating of the device. Sink current should be minimized for best accuracy. Note 5. Guaranteed by design over the operating temperature range. Not 100% production tested. Note 6. tINT and tCRIT are equal to tCONV. Note 7. TD is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 8. Note 8. tCONV = tCONV(local) + tCONV(remote). Following the acquisition of either remote or local temperature data, the limit comparisons for that zone are performed and the device status updated; Status bits will be set and /INT driven active, if applicable. Note 9. The interrupt reset propogation delay is dominated by the capacitance on the bus. Note 10. Accuracy specification does not include quantization noise, which may be up to ±1/2 LSB. Note 11. Tested at 10-bit resolution. |
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