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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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HD74AC датащи(PDF) 30 Page - Hitachi Semiconductor |
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HD74AC датащи(HTML) 30 Page - Hitachi Semiconductor |
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30 / 52 page  Definition of Specifications 29 Table 6 AC Characteristics Symbol Term Description f max Maximum clock frequency Maximum clock frequency that maintains the stable changes in output logic level in the rated sequence under the I/O condition allowing clock pulses to change the output state t TLH Rise (transient) time Rated time from low level to high level of a wavefrom during the defined transient period changing from low level to high level t THL Fall (transient) time Rated time from high level to low level of a wavefrom during the defined transient period changing from high level to low level t PLH Output rise propagation delay time Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the output changing from low level to high level t PHL Output fall propagation delay time Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the output changing from high level to low level t HZ 3-state output disable time (high level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from high level to the high-impendance state t LZ 3-state output disable time (low level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from low level to the high-impendance state t ZH 3-state output enable time (high level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from the high-impendance state to high level t ZL 3-state output enable time (low level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from the high-impendance state to low level t w Pulse width Duration of time between the rated levels from a leading edge to a trailing edge of a pulse waveform t h Hold time Time in which to hold data at the specified input terminal after a change at another related input terminal (e.g., clock input) t SU Setup time Time in which to set up and keep data at the specified input terminal before a change at another related input terminal (e.g., clock input) |
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