AD9266-65EBZ datasheet(21/33 Pages) AD

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AD9266

Data Sheet

Rev. B | Page 20 of 32

CLOCK INPUT CONSIDERATIONS

For optimum performance, clock the AD9266 sample clock inputs,

CLK+ and CLK−, with a differential signal. The signal is typically

ac-coupled into the CLK+ and CLK− pins via a transformer or

capacitors. These pins are biased internally (see Figure 45) and

require no external bias.

0.9V

AVDD

2pF

CLK–

CLK+

Figure 45. Equivalent Clock Input Circuit

Clock Input Options

The AD9266 has a very flexible clock input structure. The clock

input can be a CMOS, LVDS, LVPECL, or sine wave signal.

Regardless of the type of signal being used, clock source jitter is

of great concern, as described in the Jitter Considerations section.

Figure 46 and Figure 47 show two preferred methods for clock-

ing the AD9266 (at clock rates up to 625 MHz when using the

internal clock divider). A low jitter clock source is converted from

a single-ended signal to a differential signal using either an RF

transformer or an RF balun.

0.1µF

SCHOTTKY

DIODES:

HSMS2822

CLOCK

INPUT

50Ω

100Ω

CLK–

CLK+

ADC

Mini-Circuits®

ADT1-1WT, 1:1 Z

XFMR

Figure 46. Transformer-Coupled Differential Clock (Up to 200 MHz)

0.1µF

1nF

CLOCK

INPUT

1nF

50Ω

CLK–

CLK+

SCHOTTKY

DIODES:

HSMS2822

ADC

Figure 47. Balun-Coupled Differential Clock (Up to 625 MHz)

The RF balun configuration is recommended for clock frequencies

between 125 MHz and 625 MHz, and the RF transformer is recom-

mended for clock frequencies from 10 MHz to 200 MHz.

The back-to-back Schottky diodes across the transformer/

balun secondary limit clock excursions into the AD9266 to

approximately 0.8 V p-p differential.

This limit helps prevent the large voltage swings of the clock

from feeding through to other portions of the AD9266 while

preserving the fast rise and fall times of the signal that are

critical to a low jitter performance.

If a low jitter clock source is not available, another option is to

ac couple a differential PECL signal to the sample clock input

pins, as shown in Figure 48. The AD9510/AD9511/AD9512/

AD9513/AD9514/AD9515/AD9516-0/AD9516-1/AD9516-2/

AD9516-3/AD9516-4/AD9516-5/AD9517-0/AD9517-1/

AD9517-2/AD9517-3/AD9517-4 clock drivers offer excellent

jitter performance.

0Ω

0.1µF

240Ω

50kΩ

CLK–

CLK+

CLOCK

INPUT

CLOCK

INPUT

ADC

AD951x

PECL DRIVER

Figure 48. Differential PECL Sample Clock (Up to 625 MHz)

A third option is to ac couple a differential LVDS signal to the

sample clock input pins, as shown in Figure 49. The AD9510/

AD9511/AD9512/AD9513/AD9514/AD9515/AD9516-0/

AD9516-1/AD9516-2/AD9516-3/AD9516-4/AD9516-5/

AD9517-0/AD9517-1/AD9517-2/AD9517-3/AD9517-4 clock

drivers offer excellent jitter performance.

0Ω

0.1µF

50kΩ

CLK–

CLK+

ADC

CLOCK

INPUT

CLOCK

INPUT

AD951x

LVDS DRIVER

Figure 49. Differential LVDS Sample Clock (Up to 625 MHz)

In some applications, it may be acceptable to drive the sample

clock inputs with a single-ended 1.8 V CMOS signal. In such

applications, drive the CLK+ pin directly from a CMOS gate, and

bypass the CLK− pin to ground with a 0.1 μF capacitor (see

Figure 50).

OPTIONAL

100Ω

0.1µF

50Ω1

50Ω RESISTOR IS OPTIONAL.

CLK–

CLK+

ADC

VCC

1kΩ

CLOCK

INPUT

AD951x

CMOS DRIVER

Figure 50. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)

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