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AD9690 датащи(PDF) 63 Page - Analog Devices

номер детали AD9690
подробное описание детали  Analog-to-Digital Converter
PDF  79 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
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AD9690 датащи(HTML) 63 Page - Analog Devices

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AD9690
Data Sheet
Rev. B | Page 62 of 78
JESD204B BLOCK TEST MODES
In addition to the ADC pipeline test modes, the AD9690 also has
flexible test modes in the JESD204B block. These test modes are
listed in Register 0x573 and Register 0x574. These test patterns
can be injected at various points along the output data path. These
test injection points are shown in Figure 98. Table 30 describes
the various test modes available in the JESD204B block. For the
AD9690, a transition from test modes (Register 0x573 ≠ 0x00)
to normal mode (Register 0x573 = 0x00) requires an SPI soft
reset. This is done by writing 0x81 to Register 0x00 (self cleared).
Transport Layer Sample Test Mode
The transport layer samples are implemented in the AD9690 as
defined by section 5.1.6.3 in the JEDEC JESD204B Specification.
These tests are shown in Register 0x571[5]. The test pattern is
equivalent to the raw samples from the ADC.
Interface Test Modes
The interface test modes are described in Register 0x573 Bits[3:0].
These test modes are also explained in Table 30. The interface tests
can be injected at various points along the data. See Figure 98
for more information on the test injection points. Register 0x573
Bits[5:4] show where these tests are injected.
Table 31, Table 32, and Table 33 show examples of some of the
test modes when injected at the JESD Sample Input, PHY 10-bit
Input, and Scrambler 8-bit Input. UP in the tables represent the
user pattern control bits from the customer register map.
Table 30. JESD204B Interface Test Modes
Output Test Mode
Bit Sequence
Pattern Name
Expression
Default
0000
Off (default)
Not applicable
Not applicable
0001
Alternating checker board
0x5555, 0xAAAA, 0x5555, …
Not applicable
0010
1/0 word toggle
0x0000, 0xFFFF, 0x0000, …
Not applicable
0011
31-bit PN sequence
X31 + X28 + 1
0x0003AFFF
0100
23-bit PN sequence
X23 + X18 + 1
0x003AFF
0101
15-bit PN sequence
X15 + X14 + 1
0x03AF
0110
9-bit PN sequence
X9 + X5 + 1
0x092
0111
7-bit PN sequence
X7 + X6 + 1
0x07
1000
Ramp output
(X) % 216
Ramp size depends on test injection point
1110
Continuous/repeat user test
Register 0x551 to Register 0x558
User Pat 1 to User Pat 4, then repeat
1111
Single user test
Register 0x551 to Register 0x558
User Pat 1 to User Pat 4, then zeroes
Table 31. JESD204B Sample Input for M=1, S=2, N'=16 (Register 0x573[5:4]='b00)
Frame
Number
Converter
Number
Sample
Number
Alternating
Checkerboard
1/0 Word
Toggle
Ramp
PN9
PN23
User Repeat
User Single
0
0
0
0x5555
0x0000
(X) % 216
0x496F
0xFF5C
UP1[15:0]
UP1[15:0]
0
0
1
0x5555
0x0000
(X) % 216
0x496F
0xFF5C
UP1[15:0]
UP1[15:0]
1
0
0
0xAAAA
0xFFFF
(X +1) % 216
0xC9A9
0x0029
UP2[15:0]
UP2[15:0]
1
0
1
0xAAAA
0xFFFF
(X +1) % 216
0xC9A9
0x0029
UP2[15:0]
UP2[15:0]
2
0
0
0x5555
0x0000
(X +2) % 216
0x980C
0xB80A
UP3[15:0]
UP3[15:0]
2
0
1
0x5555
0x0000
(X +2) % 216
0x980C
0xB80A
UP3[15:0]
UP3[15:0]
3
0
0
0xAAAA
0xFFFF
(X +3) % 216
0x651A
0x3D72
UP4[15:0]
UP4[15:0]
3
0
1
0xAAAA
0xFFFF
(X +3) % 216
0x651A
0x3D72
UP4[15:0]
UP4[15:0]
4
0
0
0x5555
0x0000
(X +4) % 216
0x5FD1
0x9B26
UP1[15:0]
0x0000
4
0
1
0x5555
0x0000
(X +4) % 216
0x5FD1
0x9B26
UP1[15:0]
0x0000



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