| поискавой системы для электроныых деталей |
|
AD5241 датащи(PDF) 13 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
AD5241 датащи(HTML) 13 Page - Analog Devices |
|
13 / 16 page ![]() REV. B –13– AD5241/AD5242 Test Circuits Test Circuits 1 to 9 define the test conditions used in the product specifications table. VMS A W B DUT V V+ = VDD 1LSB = V+/2N Test Circuit 1. Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Test Circuit 2. Resistor Position Nonlinearity Error (Rheo- stat Operation; R-INL, R-DNL) VMS1 IW = VDD /RNOMINAL VMS2 VW RW = [VMS1 – VMS2]/IW A W B DUT Test Circuit 3. Wiper Resistance VMS% VDD% PSS (%/%) = V+ = VDD 10% PSRR (dB) = 20 LOG VMS VDD ( ) VDD VA VMS A W B V+ Test Circuit 4. Power Supply Sensitivity (PSS, PSRR) OP279 W 5V B VOUT OFFSET GND OFFSET BIAS A DUT Test Circuit 5. Inverting Gain B A VIN OP279 W 5V VOUT OFFSET GND OFFSET BIAS DUT Test Circuit 6. Noninverting Gain +15V –15V W A 2.5V B VOUT OFFSET GND DUT OP42 VIN Test Circuit 7. Gain vs. Frequency W B VSS TO VDD DUT ISW CODE = H RSW = 0.1V ISW 0.1V Test Circuit 8. Incremental ON Resistance W B VCM ICM A NC GND NC VSS VDD DUT Test Circuit 9. Common-Mode Leakage Current |
|
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |