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ZSSC3170 датащи(PDF) 21 Page - Integrated Device Technology

номер детали ZSSC3170
подробное описание детали  Automotive Sensor Signal Conditioner with LIN and PWM Interface
PDF  30 Pages
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производитель  IDT [Integrated Device Technology]
домашняя страница  http://www.idt.com
Logo IDT - Integrated Device Technology

ZSSC3170 датащи(HTML) 21 Page - Integrated Device Technology

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ZSSC3170 Datasheet
© 2016 Integrated Device Technology, Inc.
21
May 30, 2016
2.6.2
LIN Output
The output of the integrated LIN transceiver at the LIN pin is compatible with the LIN revisions 2.1, 2.0 and 1.3.
For details, refer to the ZSSC3170 LIN Interface Description. For LIN Physical Layer Conformance Tests, the
control pins of the integrated LIN transceiver can be accessed separately in a LIN Conformance Test Mode.
2.7
Digital Test and Calibration Interface
Beyond the digital communication features accessed via the output pins, the ZSSC3170 provides an I
2C™ com-
patible test and calibration interface with slave functionality. For a detailed description of the I
2C™ interface, refer
to the ZSSC3170 Functional Description.
2.8
Diagnostic and Failsafe Features, Watchdog, and Error Detection
The ZSSC3170 detects various possible failures. An identified failure is indicated by the ZSSC3170 entering the
Diagnostic Mode (DM). With PWM active, the respective output is switched to the resistive mode. In LIN Mode,
depending on the error classification, the correlated status bits are activated. A watchdog continuously monitors
the operations of the CMC and the running measurement loop. The operation of the internal clock oscillator is
monitored by the oscillator failure detection. A check of the sensor bridge for broken or shorted wires is performed
continuously (the sensor connection check (SCC) and the sensor short check (SSC). In PWM Mode with Low-
Side Switch (LSS) and PWM Mode with High-Side Switch (HSS), the diagnosis functions SCC and SSC are only
available from ZSSC3170 silicon
revision “F” and any subsequent revisions. The common mode voltage of the
sensor (CMV) is monitored continuously (sensor aging check (SAC)). A check for a broken chip (BCC) can be
applied in the start-up phase after power-on. RAM, ROM, EEPROM, registers, and the arithmetic unit are
monitored continuously. Refer to the ZSSC3170 Functional Description for a detailed description.
2.9
High Voltage, Reverse Polarity, and Short Circuit Protection
The ZSSC3170 is designed for a direct 12V supply, which can be provided by a vehicle power system. Internal
sub-assemblies are supplied and protected by integrated voltage regulators and limiters. Specific protection
circuits allow tolerance of permanent reverse polarity at supply and output pins. These functions are described in
detail in the document ZSSC3170 High Voltage Protection Description. When operated in the application circuits
shown in section 3, the protection features of the ZSSC3170 are guaranteed without time limit.



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