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RT6908 датащи(PDF) 9 Page - Richtek Technology Corporation |
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RT6908 датащи(HTML) 9 Page - Richtek Technology Corporation |
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9 / 22 page ![]() RT6908 9 DS6908-01 March 2013 www.richtek.com Copyright 2013 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation. © Parameter Symbol Test Conditions Min Typ Max Unit FBB2 Fault Trip Level VFBB2 Falling 0.6144 0.64 0.6656 V FBB2 Short Trip Level VFBB2 Falling -- 0.16 -- V ILIMIT2 Source Current -- 40 -- μA Low Side Switch Current Limit Cycle by Cycle -- VILIMIT2 / 8 -- V Maximum ILIMIT2 Voltage Setting -- 2.4 -- V Negative Charge Pump Controller (VGL) VGL Adjustable Output Voltage Range VGL Register Address = ”02h”, 6 bits, VGL = ( −1.8V to −8.1V) [00h to 3Fh] −8.1 -- −1.8 V VGL Regulation Voltage (Default) VGL VDRVN = 0.6V, IDRVN = −100μA −6.3 −6 −5.7 V DRVN Sink Current Limit IDRVN,MAX VDRVN = 0.6V -- 3.5 5 mA DRVN Short Circuit Current IDRVN,SC VGL > −0.5V -- 300 -- μA VGL Load Regulation Error VDRVN = 0.6V, −50μA < IDRVN < −1mA -- 60 -- mV/mA Soft-Start Period TSS -- 3 -- ms VGL Fault Trip Level VGL Rising VGL + 1.5 -- VGL + 2.5 V VGL Short Trip Level VGL Rising −0.5 V Positive Charge Pump Controller (VGH) VGH Adjustable Output Voltage Range VGH Register Address = ”01h”, 5 bits, VGH = (24.5V to 40V) [00h to 1Fh] 24.5 -- 40 V VGH Regulation Voltage (Default) VGH VDRVP = 15.6V, IDRVP = 100μA 34.79 35.5 36.21 V DRVP Source Current Limit IDRVP,MAX VDRVP = 15.6V -- 3.5 5 mA DRVP Short Circuit Current IDRVP,SC VGH < 20% -- 80 -- μA VGH Load Regulation Error VDRVP = 15.6V, 50μA < IDRVP < 1mA -- 300 -- mV/mA Soft-Start Period TSS -- 4 -- ms VGH Fault Trip Level VGH Falling VGH x 70 VGH x 75 VGH x 80 % VGH Short Trip Level VGH Falling -- 20 -- % Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. θJA is measured at TA = 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. θJC is measured at the exposed pad of the package. Note 3. Devices are ESD sensitive. Handling precaution is recommended. Note 4. The device is not guaranteed to function outside its operating conditions. |
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