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RT8092BCGWSC датащи(PDF) 10 Page - Richtek Technology Corporation |
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RT8092BCGWSC датащи(HTML) 10 Page - Richtek Technology Corporation |
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10 / 27 page ![]() RT8092 10 DS8092-03 January 2017 www.richtek.com © Copyright 2017 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation. Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. θJA is measured at TA = 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. Note 3. Devices are ESD sensitive. Handling precaution is recommended. Note 4. The device is not guaranteed to function outside its operating conditions. Parameter Symbol Test Conditions Min Typ Max Unit SDA, SCL Input Voltage High-Level 1.2 -- -- V Low-Level -- -- 0.4 Fast Mode SCL Clock Rate fSCL -- -- 400 kHz Hold Time (Repeated) START Condition. After this Period, the First Clock Pulse is Generated tHD;STA 0.6 -- -- s LOW Period of the SCL Clock tLOW 1.3 -- -- s HIGH Period of the SCL Clock tHIGH 0.6 -- -- s Set-Up Time for a Repeated START Condition tSU;STA 0.6 -- -- s Data Hold Time tHD;DAT 0 -- 0.9 s Data Set-Up Time tSU;DAT 100 -- -- ns Set-Up Time for STOP Condition tSU;STO 0.6 -- -- s Bus Free Time between a STOP and START Condition tBUF 1.3 -- -- s Rising Time of both SDA and SCL Signals tr 20 -- 300 ns Falling Time of both SDA and SCL Signals tf 20 -- 300 ns SDA and SCL Output Low Sink Current IOL SDA or SCL Voltage = 0.4V 2 -- -- mA (AVDD = 3.6V, TA = 25 °C, unless otherwise specification) I 2C for Fast Mode |
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