Data transmission

ST6G3244ME

16/27

Doc ID 022157 Rev 2

6.1

Test circuit from host to SD Card

The test circuit from the host to the SD Card is shown in Figure 6. Timings are measured for

capacitance 5 pF + SD Card capacitance 10 pF).

Figure 6.

Test circuit from host to SD Card

6.2

Test circuit from SD Card to host

The test circuit from the SD Card to the host is shown in Figure 7. Timings are measured for

capacitance + host capacitance).

Figure 7.

Test circuit from SD Card to host

Rise time for CLK feedback

See

Section 6.2

1.0

3

ns

1.0

3

Fall time for CLK feedback

See

Section 6.2

1.0

3

ns

1.0

3

Clock rate

60

MHz

Data rate

120

Mbps

1.

The time after the .dir signal transition that the device needs to switch direction, after that it is ready to accept valid data on

the switched input.

Table 12.

Symbol

Parameter

Test condition

Min. Typ. Max.

Unit

HOST

SD Card

AM04960v2

HOST

SD Card

AM04961v2