поискавой системы для электроныых деталей
  Russian  ▼
ALLDATASHEETRU.COM

X  

SPC56EL54x датащи(PDF) 33 Page - STMicroelectronics

номер детали SPC56EL54x
подробное описание детали  Dual issue five-stage pipeline core
PDF  165 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC56EL54x датащи(HTML) 33 Page - STMicroelectronics

Back Button SPC56EL54x Datasheet HTML 29Page - STMicroelectronics SPC56EL54x Datasheet HTML 30Page - STMicroelectronics SPC56EL54x Datasheet HTML 31Page - STMicroelectronics SPC56EL54x Datasheet HTML 32Page - STMicroelectronics SPC56EL54x Datasheet HTML 33Page - STMicroelectronics SPC56EL54x Datasheet HTML 34Page - STMicroelectronics SPC56EL54x Datasheet HTML 35Page - STMicroelectronics SPC56EL54x Datasheet HTML 36Page - STMicroelectronics SPC56EL54x Datasheet HTML 37Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 33 / 165 page
background image
DocID15457 Rev 12
33/165
SPC56ELx, SPC564Lx
Introduction
164
1.5.40
Voltage regulator / Power Management Unit (PMU)
The on-chip voltage regulator module provides the following features:
Single external rail required
Single high supply required: nominal 3.3 V both for packaged and Known Good Die
option
Packaged option requires external ballast transistor due to reduced dissipation
capacity at high temperature but can use embedded transistor if power dissipation
is maintained within package dissipation capacity (lower frequency of operation)
Known Good Die option uses embedded ballast transistor as dissipation capacity
is increased to reduce system cost
All I/Os are at same voltage as external supply (3.3 V nominal)
Duplicated Low-Voltage Detectors (LVD) to guarantee proper operation at all stages
(reset, configuration, normal operation) and, to maximize safety coverage, one LVD
can be tested while the other operates (on-line self-testing feature)
1.5.41
Built-In Self-Test (BIST) capability
This device includes the following protection against latent faults:
Boot-time Memory Built-In Self-Test (MBIST)
Boot-time scan-based Logic Built-In Self-Test (LBIST)
Run-time ADC Built-In Self-Test (BIST)
Run-time Built-In Self Test of LVDs



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


датащи скачать

Go To PDF Page


ссылки URL



Вашему бизинису помогли Аллдатащит?  [ DONATE ] 

Что такое Аллдатащит   |   реклама   |   контакт   |   Конфиденциальность   |   Ссылка на техническое описание    |   обмен ссыками   |   поиск по производителю
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com