LSM303D datasheet(11/52 Pages) STMICROELECTRONICS

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LSM303D

Module specifications

2.2

Temperature sensor characteristics

@ Vdd = 2.5 V, T = 25 °C unless otherwise noted(b).

M_CAS

Magnetic cross-axis sensitivity

Cross field = 0.5 gauss

Applied = ±3 gauss

±1

%FS/

gauss

M_EF

Maximum exposed field

No permanent effect on sensor

performance

10000

gauss

M_DF

Magnetic disturbance field

Sensitivity starts to degrade.

Automatic S/R pulse restores

the sensitivity(5)

gauss

LA_ST

Linear acceleration self-test

positive difference(6)

±2 g range, X-, Y-axis

AST = 1 see Table 37

1700

±2 g range, Z-axis

AST = 1 see Table 37

1700

Top

Operating temperature range

-40

+85

°C

1. Typical specifications are not guaranteed.

2. Verified by wafer level test and measurement of initial offset and sensitivity.

3. Typical zero-g level offset value after MSL3 preconditioning.

4. Offset can be eliminated by enabling the built-in high-pass filter.

5. Set/reset pulse is automatically applied at each conversion cycle.

6. “Self-test output change” is defined as: OUTPUT[mg](CTRL2 AST bit =1) - OUTPUT[mg](CTRL2 AST bit =0).

Table 3. Sensor characteristics (continued)

Symbol

Parameter

Test conditions

Min. Typ.(1) Max.

Unit

b. The product is factory calibrated at 2.5 V.

Table 4. Temperature sensor characteristics

Symbol

Parameter

Test conditions

Min.

Typ.(1)

Max.

Unit

TSDr

Temperature sensor output

change vs. temperature

LSB/°C

TODR

Temperature refresh rate

M_ODR

[2:0](2)

Top

Operating temperature range

-40

+85

°C

1. Typical specifications are not guaranteed.

2. Refer to Table 47: Magnetic data rate configuration.

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