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LMC66 датащи(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали LMC66
подробное описание детали  Low Voltage, Rail-To-Rail Input and Output CMOS
PDF  24 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
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AC Electrical Characteristics
Unless otherwise specified, all limits guaranteed for T
J = 25˚C, V
+ = 3V, V− = 0V, V
CM = VO = V
+/2, V
PD = 0.6V and RL > 1
M
Ω. Boldface limits apply at the temperature extremes (Note 16).
Symbol
Parameter
Conditions
Typ
(Note 5)
LMC6681AI
LMC6681BI
Units
LMC6682AI
LMC6682BI
LMC6684AI
LMC6684BI
Limit
Limit
(Note 6)
(Note 6)
t
ON
Time Delay for
(Note 15)
50
200
200
µs
Device to Power ON
t
OFF
Time Delay for
(Note 15)
0.5
2
2
µs
Device to Power OFF
SR
Slew Rate
(Note 8)
1.2
0.7
0.7
V/µs
min
0.55
0.55
V
+ = 10V, (Note 10)
1.2
0.7
0.7
0.55
0.55
GBW
Gain-Bandwidth Product
1.2
MHz
φ
m
Phase Margin
50
Deg
G
m
Gain Margin
12
dB
Amp-to-Amp Isolation
V
+ = 10V (Note 9)
130
dB
e
n
Input-Referred
f = 1 kHz
32
Voltage Noise
V
CM = 0.5V
i
n
Input-Referred
f = 1 kHz
0.5
Current Noise
T.H.D.
Total Harmonic Distortion
f = 1 kHz, A
V = +1
0.01
%
R
L = 10 kΩ,VO = 2VPP
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating ratings indicate conditions for which the device is in-
tended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the electrical characteristics.
Note 2: Human body model, 1.5 k
Ω in series with 100 pF.
Note 3: Applies to both single-supply and split-supply operation. Continous short circuit operation at elevated ambient temperature can result in exceeding the maxi-
mum allowed junction temperature of 150˚C. Output current in excess of ±30 mA over long term may adversely affect reliability.
Note 4: The maximum power dissipation is a function of TJ (max), θJA, and TA. The maximum allowable power dissipation at any ambient temperature is PD = (TJ(max)
−TA)/θJA. All numbers apply for packages soldered directly into a PC board.
Note 5: Typical Values represent the most likely parametric norm.
Note 6: All limits are guaranteed by testing or statistical analysis.
Note 7: V+ = 3V, VCM = 0.5V. For sourcing and sinking, 0.5V ≤ VO ≤ 2.5V.
Note 8: V+ = 3V. Connected as Voltage Follower with 2V step input, and the output is measured from 15%–85%. Number specified is the slower of the positive or
negative slew rates.
Note 9: Input referred, V+ = 10V, and RL = 100 kΩ connected to 5V. Each amp excited in turn with 1 kHz to produce VO = 2VPP.
Note 10: V+ = 10V. Connected as voltage follower with 8V step Input, and output is measured from 15%–85%. Number specified is the slower of the positive or nega-
tive slew rates.
Note 11: Limiting input pin current is only necessary for input voltages that exceed absolute maximum input voltage ratings.
Note 12: Guaranteed limits are dictated by tester limitations and not device performance. Actual performance is reflected in the typical value.
Note 13: CMRR+ and CMRRare tested, and the number indicated is the lower of the two values. For CMRR+,V+/2 < VCM < V
+ for 1.8V, 2.2V, 3V, 5V, and 10V.
For CMRR,0 < VCM < V
+/2 for 3V, 5V and 10V. For 1.8V and 2.2V, 0.25 < V
CM < V
+ − 0.3.
Note 14: V+ = 10V, VCM = 0.5V. For Sourcing tests, 1V ≤ VO ≤ 5V. For Sinking tests, 5V ≤ VO ≤ 9V.
Note 15: The propogation delays are measured using an input waveform of f = 5 Hz, and magnitude of 2.4V. Refer to Section 6.3 and
Figures 14, 15 for a detailed
explanation.
Note 16: The VPD (threshold low and threshold high) limits are guaranteed at room temperature and at temperature extremes. Room temperature limits are produc-
tion tested. Limits at temperature extremes are guaranteed via correlation using temperature regression analysis methods. Refer to Section 6.2 for an overview of
the threshold voltages.
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