CAT93C86

www.onsemi.com

3

Symbol

Test

Conditions

Min

Typ

Max

Units

Output Capacitance (DO)

5

pF

Input Capacitance (CS, SK, DI, ORG)

5

pF

Symbol

Parameter

Max

Units

Power−up to Read Operation

1

ms

Power−up to Write Operation

1

ms

Table 6. A.C. TEST CONDITIONS

Input Rise and Fall Times

≤ 50 ns

Input Pulse Voltages

0.4 V to 2.4 V

4.5 V

Timing Reference Voltages

0.8 V, 2.0 V

4.5 V

Input Pulse Voltages

1.8 V

Timing Reference Voltages

1.8 V

Table 7. A.C. CHARACTERISTICS

Symbol

Parameter

Test Conditions

1.8 V − 5.5 V

2.5 V − 5.5 V

4.5 V − 5.5 V

Units

Min

Max

Min

Max

Min

Max

CS Setup Time

200

100

50

ns

CS Hold Time

0

0

0

ns

DI Setup Time

200

100

50

ns

DI Hold Time

200

100

50

ns

Output Delay to 1

1

0.5

0.15

ms

Output Delay to 0

1

0.5

0.15

ms

Output Delay to High−Z

400

200

100

ns

Program/Erase Pulse Width

5

5

5

ms

Minimum CS Low Time

1

0.5

0.15

ms

Minimum SK High Time

1

0.5

0.15

ms

Minimum SK Low Time

1

0.5

0.15

ms

Output Delay to Status Valid

1

0.5

0.1

ms

Maximum Clock Frequency

DC

500

DC

1000

DC

3000

kHz

5. These parameters are tested initially and after a design or process change that affects the parameter.

7. The input levels and timing reference points are shown in the “A.C. Test Conditions” table.