If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage, V

CC

+90V

Bias Voltage, V

BB

+16V

Input Voltage, V

IN

0V to 6V

Storage Temperature Range, T

STG

−65˚C to +150˚C

300˚C

ESD Tolerance

Human Body Model

2 kV

Machine Model

250V

V

CC

+60V to +85V

V

BB

+8V to +15V

V

IN

+1V to +5V

V

+15V to +75V

Case Temperature

−20˚C to +100˚C

Do not operate the part without a heat sink.

Electrical Characteristics

(See

Figure 2 for Test Circuit)

Unless otherwise noted: V

Symbol

Parameter

Conditions

LM2412

Units

Min

Typ

Max

I

CC

Supply Current

Per Channel, No Output Load

16

21

26

mA

I

BB

Bias Current

All Three Channels

27

42

57

mA

V

OUT

DC Output Voltage

V

62

65

68

V

DC

A

V

DC Voltage Gain

−12

−14

−16

∆A

V

Gain Matching

(Note 4)

1.0

dB

LE

Linearity Error

(Notes 4, 5)

3.5

%

t

r

Rise Time (Notes 6, 7)

10% to 90%,40V

2.8

3.5

ns

t

f

Fall Time (Notes 6, 7)

10% to 90%,40V

2.8

3.5

ns

OS

Overshoot

40 V

5

%

Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices

should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.

Note 2: All voltages are measured with respect to GND, unless otherwise specified.

Note 3: Operating ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and

test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may

change when the device is not operated under the listed test conditions.

Note 4: Calculated value from voltage gain test on each channel.

Note 7: 100% tested in production. These limits are not used to calculate outgoing quality levels.

AC Test Circuit

Figure 2 shows a typical test circuit for evaluation of the

LM2412. This circuit is designed to allow testing of the

LM2412 in a 50

Ω environment without the use of an expen-

sive FET probe. The combined resitors of 4950

Ω at the out-

put form a 200:1 voltage divider when connected to a 50

Ω

load. The test board supplied by NSC also offers the option

to test theLM2412 with a FET probe. C

tance at the LM2412 output, including the board capaci-

tance.

DS101298-3

FIGURE 2. Test Circuit (One Channel)

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