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BQ76PL455APFCR датащи(PDF) 39 Page - Texas Instruments |
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BQ76PL455APFCR датащи(HTML) 39 Page - Texas Instruments |
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39 / 125 page ![]() 39 bq76PL455A www.ti.com SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 7.3.12.6.1 Checksum Testing Each of the checksums (TI, USER spaces) has a test mode that causes each input bit in the checksum calculation (that is, the register bits that are part of the checksum calculation) to flip twice (once per clock) and the TEST_CSUM register contains the count for the number of toggles on the checksums fault output. This helps to ensure that the background checksum testing described previously correctly discovers any bit that might be in the wrong state. The user's firmware, usually as a part of self-testing and validation, can initiate the tests. The TESTCTRL[CKSUM_TEST_RUN] bits are set to begin the test on either the TI or USER space registers. See TESTCTRL 0x20–21 (32–33) Test Control for details of the bit settings. NOTE Other faults may be set in the process of running this procedure, but ignore those. 7.3.12.6.1.1 Computing User Checksum The user checksum is a 32-bit value computed using all the data values in the user data space. The computation is a simple 32 bit add of registers and constants concatenated into 32-bit values. The computation, shown below, consists of the data at the address specified or 0: cust_cksum_calc = {0, 0, 0, a3} + {a4, a5, a6, a7} + {0, 0, a10, a11} + {0, a13, a14, a15} + {a16, a17, a18, a19} + {a20, a21, 0, 0} + {0, 0, a30, a31}+ {0, 0, a34, a35}+ {a36, a37, 0, 0} + {a40, 0, 0, 0}+ {0, 0,a50, a51}+ {a52, a53, a54, a55} + {0, a61, a62, a63} + {a64, a65, a66, a67} + {a68, 0, 0, 0}+ {a104, a105, a106, a107} + {a108, 0, a110, a111} + {a120, a121, a122, a123} + {0, a125, 0, 0}+ {a140, a141, a142, a143} + {a144, a145, a146, a147} + {a148, a149, a150, a151} + {a152, a153, a154, a155} + {a156, a157, a158, a159} + {a160, a161, a162, a163} + {a164, a165, a166, a167} + {a168, a169, a170, a171} + {a172, a173, a174, a175} + {a176, a177, 0, 0} + {a200, a201, a202, a203} + {a204, a205, a206, a207} + {0, 0, a210, a211} + {a212, a213, a214, a215} + {a216, a217, a218, a219} + {a220, a221, a222, a223} + {a224, a225, a226, a227}; NOTE In the example code, a_ refers to register address number. For example: a3 = register address 0x03. 7.3.12.7 AUXn OV/UV Threshold Faults The AUXn input pins can trigger a fault indication. The OV and UV thresholds for each AUXn input can be set separately in the AUXn_OV and AUXn_UV registers. The result of each AUXn channel conversion is compared to these values. When the threshold is exceeded (less-than AUXn_UV, greater-than AUXn[OV]), the FAULT_N and FAULTL pins are asserted, if enabled. To stop unwanted FAULT pin assertions from one or more channels (but other channels are desired), set the threshold voltage settings for the undesired channels to their minimum and maximum values or only convert the desired channels. |
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