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BQ76PL455APFCR датащи(PDF) 39 Page - Texas Instruments

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номер детали BQ76PL455APFCR
подробное описание детали  16-Cell Industrial Integrated Battery Monitor
PDF  125 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI1 - Texas Instruments

BQ76PL455APFCR датащи(HTML) 39 Page - Texas Instruments

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bq76PL455A
www.ti.com
SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016
Product Folder Links: bq76PL455A
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
7.3.12.6.1
Checksum Testing
Each of the checksums (TI, USER spaces) has a test mode that causes each input bit in the checksum
calculation (that is, the register bits that are part of the checksum calculation) to flip twice (once per clock) and
the TEST_CSUM register contains the count for the number of toggles on the checksums fault output. This helps
to ensure that the background checksum testing described previously correctly discovers any bit that might be in
the wrong state.
The user's firmware, usually as a part of self-testing and validation, can initiate the tests. The
TESTCTRL[CKSUM_TEST_RUN] bits are set to begin the test on either the TI or USER space registers. See
TESTCTRL 0x20–21 (32–33) Test Control for details of the bit settings.
NOTE
Other faults may be set in the process of running this procedure, but ignore those.
7.3.12.6.1.1
Computing User Checksum
The user checksum is a 32-bit value computed using all the data values in the user data space. The computation
is a simple 32 bit add of registers and constants concatenated into 32-bit values. The computation, shown below,
consists of the data at the address specified or 0:
cust_cksum_calc =
{0, 0, 0, a3} +
{a4, a5, a6, a7} +
{0, 0, a10, a11} +
{0, a13, a14, a15} +
{a16, a17, a18, a19} +
{a20, a21, 0, 0} +
{0, 0, a30, a31}+
{0, 0, a34, a35}+
{a36, a37, 0, 0} +
{a40, 0, 0, 0}+
{0, 0,a50, a51}+
{a52, a53, a54, a55} +
{0, a61, a62, a63} +
{a64, a65, a66, a67} +
{a68, 0, 0, 0}+
{a104, a105, a106, a107} +
{a108, 0, a110, a111} +
{a120, a121, a122, a123} +
{0, a125, 0, 0}+
{a140, a141, a142, a143} +
{a144, a145, a146, a147} +
{a148, a149, a150, a151} +
{a152, a153, a154, a155} +
{a156, a157, a158, a159} +
{a160, a161, a162, a163} +
{a164, a165, a166, a167} +
{a168, a169, a170, a171} +
{a172, a173, a174, a175} +
{a176, a177, 0, 0} +
{a200, a201, a202, a203} +
{a204, a205, a206, a207} +
{0, 0, a210, a211} +
{a212, a213, a214, a215} +
{a216, a217, a218, a219} +
{a220, a221, a222, a223} +
{a224, a225, a226, a227};
NOTE
In
the
example
code,
a_
refers
to
register
address
number. For example: a3 =
register address 0x03.
7.3.12.7 AUXn OV/UV Threshold Faults
The AUXn input pins can trigger a fault indication. The OV and UV thresholds for each AUXn input can be set
separately in the AUXn_OV and AUXn_UV registers. The result of each AUXn channel conversion is compared
to these values. When the threshold is exceeded (less-than AUXn_UV, greater-than AUXn[OV]), the FAULT_N
and FAULTL pins are asserted, if enabled. To stop unwanted FAULT pin assertions from one or more channels
(but other channels are desired), set the threshold voltage settings for the undesired channels to their minimum
and maximum values or only convert the desired channels.



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