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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ADS1216 датащи(PDF) 2 Page - Texas Instruments |
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ADS1216 датащи(HTML) 2 Page - Texas Instruments |
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2 / 28 page  ADS1216 2 SBAS171B ELECTRICAL CHARACTERISTICS: AVDD = 5V All specifications TMIN to TMAX, AVDD = +5V, DVDD = +2.7V to 5.25V, fMOD = 19.2kHz, PGA = 1, Buffer ON, RDAC = 150kΩ, fDATA = 10Hz, VREF ≡ (REF IN+) – (REF IN–) = +2.5V, unless otherwise specified. AVDD to AGND ...................................................................... –0.3V to +6V DVDD to DGND ...................................................................... –0.3V to +6V Input Current ............................................................... 100mA, Momentary Input Current ................................................................. 10mA, Continuous AIN ................................................................... GND –0.5V to AVDD + 0.5V AVDD to DVDD ........................................................................... –6V to +6V AGND to DGND ................................................................. –0.3V to +0.3V Digital Input Voltage to GND .................................... –0.3V to DVDD + 0.3V Digital Output Voltage to GND ................................. –0.3V to DVDD + 0.3V Maximum Junction Temperature ................................................... +150 °C Operating Temperature Range ......................................... –40 °C to +85°C Storage Temperature Range .......................................... –60 °C to +100°C Lead Temperature (soldering, 10s) .............................................. +300 °C NOTE: (1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. ABSOLUTE MAXIMUM RATINGS(1) PACKAGE SPECIFIED DRAWING TEMPERATURE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE NUMBER RANGE MARKING NUMBER(1) MEDIA ADS1216Y TQFP-48 PFB –40 to +85 ADS1216Y ADS1216Y/250 Tape and Reel "" " " " ADS1216Y/2K Tape and Reel NOTE: (1) Models with a slash (/) are available only in Tape and Reel in the quantities indicated (e.g., / 2K indicates 2000 devices per reel). Ordering 2000 pieces of “ADS1216Y/2K” will get a single 2000-piece Tape and Reel. PACKAGE/ORDERING INFORMATION ADS1216 PARAMETER CONDITIONS MIN TYP MAX UNITS ANALOG INPUT (AIN0 – AIN7, AINCOM) Analog Input Range Buffer OFF AGND – 0.1 AVDD + 0.1 V Buffer ON AGND + 0.05 AVDD – 1.5 V Full-Scale Input Voltage Range (In+) – (In–), See Block Diagram ±V REF /PGA V Differential Input Impedance Buffer OFF 5/PGA M Ω Input Current Buffer ON 0.5 nA Bandwidth Fast Settling Filter –3dB 0.469 • fDATA Hz Sinc2 Filter –3dB 0.318 • fDATA Hz Sinc3 Filter –3dB 0.262 • fDATA Hz Programmable Gain Amplifier User Selectable Gain Ranges 1 128 Input Capacitance 9pF Input Leakage Current Modulator OFF, T = 25 °C5 pA Burnout Current Sources 2 µA OFFSET DAC Offset DAC Range ±V REF /(2 • PGA) V Offset DAC Monotonicity 8 Bits Offset DAC Gain Error ±10 % Offset DAC Gain Error Drift 1 ppm/ °C SYSTEM PERFORMANCE Resolution 24 Bits No Missing Codes sinc3 Filter 24 Bits Integral Non-Linearity End Point Fit ±0.0015 % of FS Offset Error(1) 7.5 ppm of FS Offset Drift(1) 0.02 ppm of FS/ °C Gain Error(1) 0.005 % Gain Error Drift(1) 0.5 ppm/ °C Common-Mode Rejection at DC 100 dB fCM = 60Hz, fDATA = 10Hz 130 dB fCM = 50Hz, fDATA = 50Hz 120 dB fCM = 60Hz, fDATA = 60Hz 120 dB Normal-Mode Rejection fSIG = 50Hz, fDATA = 50Hz 100 dB fSIG = 60Hz, fDATA = 60Hz 100 dB Output Noise See Typical Characteristics Power-Supply Rejection at DC, dB = –20 log( ∆V OUT /∆VDD) (2) 80 95 dB ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Texas Instru- ments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |
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