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TMS570LS3134 датащи(PDF) 7 Page - Texas Instruments |
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TMS570LS3134 датащи(HTML) 7 Page - Texas Instruments |
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7 / 167 page ![]() TMS570LS3134, TMS570LS2134, TMS570LS2124 www.ti.com SPNS165B – APRIL 2012 – REVISED MAY 2015 2 Revision History This data manual revision history highlights the technical changes made to the SPNS165A device-specific data manual to make it an SPNS165B revision. Scope: Applicable updates to the Hercules™ TMS570 MCU device family, specifically relating to the TMS570LS31x4/21x4 devices, which are now in the production data (PD) stage of development have been incorporated. Changes from October 1, 2013 to May 15, 2015 (from A Revision (September 2013) to B Revision) Page • Section 1 (Device Overview): Updated/Changed section title ................................................................. 1 • Updated/Changed the N2HET feature ............................................................................................. 1 • Section 1.3(Description): Corrected DMA description, 32 peripheral requests, not 32 control packets ................... 4 • (Device Information): Added table .................................................................................................. 4 • Added Section 3, Device Comparison ............................................................................................. 9 • Section 4 (Terminal Configuration and Functions): Updated/Changed section title ........................................ 10 • Table 4-2 (PGE Enhanced Next Generation High-End Timer Modules (N2HET1, N2HET2)): Updated/Changed N2HET1 time input capture or output compare pin description ............................................................... 14 • Table 4-2: Added N2HET1_PIN_nDIS signal DESCRIPTION ................................................................ 14 • Table 4-2: Updated/Changed N2HET2 time input capture or output compare pin description ........................... 15 • Table 4-2: Added N2HET2_PIN_nDIS signal DESCRIPTION ................................................................ 15 • Table 4-3: Added table note describing limits on pin 55 when configured as GIOB[2] ................................... 15 • Table 4-12 (PGE Test and Debug Modules Interface): Updated/Changed TEST pin description ........................ 18 • Table 4-18 (ZWT Enhanced Next Generation High-End Timer (N2HET) Modules): Updated/Changed N2HET1 time input capture or output compare pin description .......................................................................... 22 • Table 4-18: Added alternate terminals for N2HET1 pins 17, 19, 21, 23, 25, 27, 29 and 31 .............................. 22 • Table 4-18: Added N2HET1_PIN_nDIS signal DESCRIPTION ............................................................... 22 • Table 4-18: Updated/Changed N2HET2 time input capture or output compare pin description .......................... 23 • Table 4-18: Added N2HET2_PIN_nDIS signal DESCRIPTION ............................................................... 23 • Table 4-19: Updated description about using GIOB[2] on ball V10 .......................................................... 24 • Table 4-26 (External Memory Interface (EMIF)): Global: Deleted EMIF_RNW pin function. .............................. 28 • Table 4-32 (ZWT Test and Debug Modules Interface): Updated/Changed TEST pin description ....................... 34 • Table 4-34: Changed six BGA balls from NC to Reserved .................................................................... 34 • Section 5 (Specifications): Updated/Changed section title .................................................................... 39 • Section 5.1 (Absolute Maximum Ratings): Reformatted table ................................................................. 39 • Section 5.1 (Absolute Maximum Ratings): Updated/Changed VCCAD supply voltage range MAX value from "5.5" to "6.25" V ............................................................................................................................ 39 • Section 5.1: Updated/Changed ADC input pins input voltage range MAX value from "5.5" to "6.25" V ................. 39 • Section 5.2 (ESD Ratings): Added table (new) .................................................................................. 39 • Section 5.3 (Power-On Hours (POH)): Added table (new) .................................................................... 39 • Table 5-1 (Clock Domain Timing Specifications): Added VCLK, VCLK2, VCLK3, VCLKA1 frequency limits ........... 41 • Section 5.8 (Input/Output Electrical Characteristics): Updated/Changed Input Clamp Current from IIC to IIK........... 43 • Section 5.9 (Thermal Resistance Characteristics): Moved section and updated/changed subsection title. ............ 44 • Table 5-2 (Thermal Resistance Characteristics (PGE Package)): Added test conditions and added ΨJT row for PGE package ........................................................................................................................ 44 • Table 5-3 (Thermal Resistance Characteristics (ZWT Package)): Added test conditions and added ΨJT row for ZWT package ........................................................................................................................ 44 • Clarified impact of SPI2PC9 register on drive strength of SPI2SOMI pin .................................................. 45 • Updated/Changed the MIN value of tv(RST) to 2256tc(OSC) ns .................................................................. 54 • Section 6.5.1: Added Quantity of Breakpoints and Watchpoints ............................................................. 55 • Section 6.6.1 (Clock Sources): Added Table 6-8, Available Clock Source cross-references ............................. 59 • Section 6.6.1.1 (Main Oscillator): Added Figure 6-4, Recommended Crystal/Clock Connection cross-reference ..... 59 • Table 6-13 (Clock Domain Descriptions): Added missing "1" to the VCLKACON clock source selection register name for VCLKA3 row .............................................................................................................. 64 • Section 6.9.1 (Memory Map Diagram): Added additional device-specific memory map ................................... 71 • Table 6-20 (Device Memory Map): Corrected size of bank 7 OTP and bank 7 OTP ECC ................................ 73 • Figure 6-12 (TCRAM Block Diagram): Updated/Changed figure, deleted A TCM .......................................... 81 • Table 6-25 (PBIST RAM Grouping): Added table footnotes identifying the address ranges of the ESRAM PBIST groups ................................................................................................................................. 83 Copyright © 2012–2015, Texas Instruments Incorporated Revision History 7 Submit Documentation Feedback |
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