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TMS570LS3134 датащи(PDF) 39 Page - Texas Instruments |
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TMS570LS3134 датащи(HTML) 39 Page - Texas Instruments |
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39 / 167 page ![]() TMS570LS3134, TMS570LS2134, TMS570LS2124 www.ti.com SPNS165B – APRIL 2012 – REVISED MAY 2015 5 Specifications 5.1 Absolute Maximum Ratings (1) Over Operating Free-Air Temperature Range MIN MAX UNIT VCC (2) –0.3 1.43 Supply voltage VCCIO, VCCP (2) –0.3 4.6 V VCCAD –0.3 6.25 All input pins –0.3 4.6 Input voltage V ADC input pins –0.3 6.25 IIK (VI < 0 or VI > VCCIO) –20 20 All pins, except AD1IN[23:0] and AD2IN[15:0] mA Input clamp current IIK (VI < 0 or VI > VCCAD) –10 10 AD1IN[23:0] and AD2IN[15:0] Total –40 40 mA Operating free-air temperature, TA: –40 125 °C Operating junction temperature, TJ: –40 150 °C Storage temperature, Tstg –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated grounds. 5.2 ESD Ratings VALUE UNIT Human body model (HBM), per AEC Q100-002(1) ±2 kV All pins ±500 Electrostatic discharge Corner pins on 144-pin PGE VESD Charged device model (CDM), ±750 (ESD) performance: (1, 36, 37, 72, 73, 108, 109, 144) V per AEC Q100-011 Corner balls on 337-ball ZWT ±750 (A1, A19, W1, W19) (1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS ‑001 specification. 5.3 Power-On Hours (POH) (1) (2) JUNCTION NOMINAL CORE VOLTAGE (VCC) LIFETIME POH TEMPERATURE (Tj) 1.2 105ºC 100K (1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms and conditions for TI semiconductor products. (2) To avoid significant degradation, the device power-on hours (POH) must be limited to those specified in this table. To convert to equivalent POH for a specific temperature profile, see the Calculating Equivalent Power-on-Hours for Hercules Safety MCUs Application Report (SPNA207). Copyright © 2012–2015, Texas Instruments Incorporated Specifications 39 Submit Documentation Feedback |
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