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LP8555 датащи(PDF) 4 Page - Texas Instruments |
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LP8555 датащи(HTML) 4 Page - Texas Instruments |
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4 / 64 page ![]() LP8555 SNVS857 – FEBRUARY 2014 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings (1) Over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VDD Voltage on VDD –0.3 22 VLDO Voltage on VLDO V(PWM/INT, –0.3 6 EN/VDDIO/ V Voltage on logic terminals FSET/SDA, ISET/SCL) V(SW_A, SW_B, Voltage on analog terminals –0.3 31 LEDxy, FB_x) Internally PD Continuous Power Dissipation (2) limited TA Operating ambient temperature range (3) –40 85 TJ Maximum operating junction temperature (3) –40 125 °C Tsoldering Note (4) (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability. (2) Internal thermal shutdown circuitry protects the device from permanent damage. Thermal shutdown engages at TJ = 150°C (typ.) and disengages at TJ = 137°C (typ.). (3) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be degraded. Maximum ambient temperature (TA-MAX) is dependent on the maximum operating junction temperature (TJ-MAX-OP = 125ºC), the maximum power dissipation of the device in the application (PD-MAX), and the junction-to ambient thermal resistance of the part/package in the application ( θJA), as given by the following equation: TA-MAX = TJ-MAX-OP – (θJA × PD-MAX). (4) For detailed soldering specifications and information, please refer to Application Note AN1112. 7.2 Handling Ratings MIN MAX UNIT TSTORAGE Storage temp range –65 150 °C VHBM Human body model (HBM) voltage(1) 2000 V VCDM Charged device model (CDM) (2) 250 (1) Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Terminals listed as 2 kV may actually have higher performance. (2) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Terminals listed as 250 V may actually have higher performance 4 Submit Documentation Feedback Copyright © 2014, Texas Instruments Incorporated Product Folder Links: LP8555 |
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