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LP2998MA/NOPB датащи(PDF) 6 Page - Texas Instruments |
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LP2998MA/NOPB датащи(HTML) 6 Page - Texas Instruments |
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6 / 33 page ![]() LP2998, LP2998-Q1 SNVS521K – DECEMBER 2007 – REVISED AUGUST 2014 www.ti.com 7.6 Electrical Characteristics Typical limits tested at TJ = 25°C. Minimum and maximum limits apply over the full operating junction temperature range (TJ = –40°C to 125°C). (1) Unless otherwise specified, AVIN = PVIN = 2.5 V, VDDQ = 2.5 V.(2) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIN = VDDQ = 2.3 V 1.135 1.158 1.185 VREF voltage (DDR I) VIN = VDDQ = 2.5 V 1.235 1.258 1.285 VIN = VDDQ = 2.7 V 1.335 1.358 1.385 PVIN = VDDQ = 1.7 V 0.837 0.860 0.887 VREF VREF voltage (DDR II) PVIN = VDDQ = 1.8 V 0.887 0.910 0.937 V PVIN = VDDQ = 1.9 V 0.936 0.959 0.986 PVIN = VDDQ = 1.35V 0.669 0.684 0.699 VREF Voltage (DDR III) PVIN = VDDQ = 1.5V 0.743 0.758 0.773 PVIN = VDDQ = 1.6V 0.793 0.808 0.823 ZVREF VREF Output Impedance IREF = –30 to 30 µA 2.5 k Ω IOUT = 0 A VIN = VDDQ = 2.3 V 1.120 1.159 1.190 VIN = VDDQ = 2.5 V 1.210 1.259 1.290 VIN = VDDQ = 2.7 V 1.320 1.359 1.390 VTT VTT Output Voltage (DDR I) (3) V IOUT = ±1.5 A VIN = VDDQ = 2.3 V 1.125 1.159 1.190 VIN = VDDQ = 2.5 V 1.225 1.259 1.290 VIN = VDDQ = 2.7 V 1.325 1.359 1.390 IOUT = 0 A, AVIN = 2.5 V PVIN = VDDQ = 1.7 V 0.822 0.856 0.887 PVIN = VDDQ = 1.8 V 0.874 0.908 0.939 PVIN = VDDQ = 1.9 V 0.923 0.957 0.988 VTT Output Voltage (DDR II) (3) V IOUT = ±0.5A, AVIN = 2.5 V PVIN = VDDQ = 1.7 V 0.820 0.856 0.890 PVIN = VDDQ = 1.8 V 0.870 0.908 0.940 PVIN = VDDQ = 1.9 V 0.920 0.957 0.990 IOUT = 0A, AVIN = 2.5 V PVIN = VDDQ = 1.35V 0.656 0.677 0.698 PVIN = VDDQ = 1.5 V 0.731 0.752 0.773 PVIN = VDDQ = 1.6 V 0.781 0.802 0.823 IOUT = 0.2 A, AVIN = 2.5V 0.667 0.688 0.710 PVIN = VDDQ = 1.35V IOUT = -0.2A, AVIN = 2.5V 0.641 0.673 0.694 PVIN = VDDQ = 1.35V VTT Output Voltage (DDR III) (3) V IOUT = 0.4 A, AVIN = 2.5 V 0.740 0.763 0.786 PVIN = VDDQ = 1.5 V IOUT = –0.4 A, AVIN = 2.5 V 0.731 0.752 0.773 PVIN = VDDQ = 1.5 V IOUT = 0.5 A, AVIN = 2.5 V 0.790 0.813 0.836 PVIN = VDDQ = 1.6 V IOUT = –0.5 A, AVIN = 2.5 V 0.781 0.802 0.823 PVIN = VDDQ = 1.6 V (1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL). (2) VIN is defined as VIN = AVIN = PVIN. (3) VTT load regulation is tested by using a 10 ms current pulse and measuring VTT. 6 Submit Documentation Feedback Copyright © 2007–2014, Texas Instruments Incorporated Product Folder Links: LP2998 LP2998-Q1 |
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