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DP83953 датащи(PDF) 89 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали DP83953
подробное описание детали  Repeater Interface Controller with Security Features, Internal Drivers and Integrated Filters
PDF  90 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP83953 датащи(HTML) 89 Page - National Semiconductor (TI)

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9.0 DC and AC Specification (Continued)
AC Timing Test Conditions
All specifications are valid only if the mandatory isolation is employed and all differential signals are taken to be at AUI
side of the transformer.
Output Load (See Figure Below)
Note 1:
100 pF, includes scope and jig capacitance.
Note 2:
S1 = Open for timing tests for push pull outputs.
S1 = VDD for VOL test.
S1 = GND for VOH test.
S1 = VDD for High Impedance to active low and active low to High Impedance measurements.
S1 = GND for High Impedance to active high and active high to High Impedance measurements.
Capacitance TA = 25°C, f = 1 MHz
Derating Factor
Output timing are measured with a purely capacitive load for 50pF. The following correction factor can be used for other
loads: CL
≥50pF+0.3ns/pF
Note: In the above diagram, the TX+ and TX- signals are taken from the AUI side of the isolation (transformer).
Input Pulse Levels (TTL/CMOS)
GND to 3.0V
Input Rise and Fall Times (TTL/CMOS)
5ns
Input and Output Reference Levels (TTL/CMOS)
1.5V
Input Pulse Levels (Diff.)
2Vp-p
Input and Output Reference Levels (Diff.)
50% Point of the Differential
TRI-STATE Reference Levels
Float (
∆V)±0.5V
Symbol
Parameter
Typ Units
CIN
Input Capacitance
7
pf
COUT Output Capacitance
7
pf
Figure 27. Output Loading for the Device Under Test



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