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DP83924 датащи(PDF) 7 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали DP83924
подробное описание детали  Quad 10 Mb/s Ethernet Physical Layer - 4TPHY?
PDF  42 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
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DP83924 датащи(HTML) 7 Page - National Semiconductor (TI)

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1.0 Pin Information (Continued)
7
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Table 3. LED & GENERAL CONFIGURATION Pins (8 Pins)
Symbol
Pins
Type
Description
LED_DATA
88
O
LED serial data output: This pin outputs the serial LED data. See S ection2.3 for a de-
scription of the LED modes. This output should be connected to the input of the 1st (ex-
ternal) serial shift register.
LED_CLK
87
O
LED Clock: This is the clock for the serial shift registers
X1
95
I
External Oscillator Input: This signal is used to provide clocking signals for the internal
ENDEC. A 20MHz oscillator module should be used to drive this pin.
RESET
39
I
Reset: Active low input resets the transceiver, and starts the initialization of the device.
This pin has a noise filter on it’s input, which requires that the reset pulse must be greater
than 30 X1 clocks.
FDX[4:1]
38 -35
I
Full Duplex: These pins are sampled during reset. They control the full duplex (or half
duplex) configuration of each port. If pulled low, Full Duplex operation is selected for the
respective port. If pulled high, Half Duplex operation is selected. These pins have no in-
ternal pull-up or pull-down resistors.These pins are also used in “Enhanced full duplex”
mode to dynamically select Full/Half duplex mode of operat i on. See Section3.3.14
Table 4. SCAN TEST Pins (5 Pins)
Symbol
Pins
Type
Description
TCK
79
I
Test Clock: This signal is used during boundary scan to clock data in and out
of the device.
TDI
82
I
Test Input: The signal contains serial data that is shifted into the device by the
TAP controller. An internal pullup is provided if not used. It is recommended that
during normal transceiver operation a ‘1’ should be applied to this pin.
TDO
78
O,Z
Test Output:The tristateable signal contains serial data that is shifted out of the
device by the TAP controller.
TMS
83
I
Test Mode Select: This selects the operation mode of the TAP controller. An
internal pullup is provided if not used
TRST
84
I
Test Reset: When this signal is asserted low it forces the TAP (Test Access
Port) controller into a logic reset state. An internal pullup is provided. This pin
should be pulled low during normal transceiver operation.



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