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DP83924 датащи(PDF) 7 Page - National Semiconductor (TI) |
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DP83924 датащи(HTML) 7 Page - National Semiconductor (TI) |
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7 / 42 page ![]() 1.0 Pin Information (Continued) 7 www.national.com Table 3. LED & GENERAL CONFIGURATION Pins (8 Pins) Symbol Pins Type Description LED_DATA 88 O LED serial data output: This pin outputs the serial LED data. See S ection2.3 for a de- scription of the LED modes. This output should be connected to the input of the 1st (ex- ternal) serial shift register. LED_CLK 87 O LED Clock: This is the clock for the serial shift registers X1 95 I External Oscillator Input: This signal is used to provide clocking signals for the internal ENDEC. A 20MHz oscillator module should be used to drive this pin. RESET 39 I Reset: Active low input resets the transceiver, and starts the initialization of the device. This pin has a noise filter on it’s input, which requires that the reset pulse must be greater than 30 X1 clocks. FDX[4:1] 38 -35 I Full Duplex: These pins are sampled during reset. They control the full duplex (or half duplex) configuration of each port. If pulled low, Full Duplex operation is selected for the respective port. If pulled high, Half Duplex operation is selected. These pins have no in- ternal pull-up or pull-down resistors.These pins are also used in “Enhanced full duplex” mode to dynamically select Full/Half duplex mode of operat i on. See Section3.3.14 Table 4. SCAN TEST Pins (5 Pins) Symbol Pins Type Description TCK 79 I Test Clock: This signal is used during boundary scan to clock data in and out of the device. TDI 82 I Test Input: The signal contains serial data that is shifted into the device by the TAP controller. An internal pullup is provided if not used. It is recommended that during normal transceiver operation a ‘1’ should be applied to this pin. TDO 78 O,Z Test Output:The tristateable signal contains serial data that is shifted out of the device by the TAP controller. TMS 83 I Test Mode Select: This selects the operation mode of the TAP controller. An internal pullup is provided if not used TRST 84 I Test Reset: When this signal is asserted low it forces the TAP (Test Access Port) controller into a logic reset state. An internal pullup is provided. This pin should be pulled low during normal transceiver operation. |
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