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PACKAGE/ORDERING INFORMATION

ABSOLUTE MAXIMUM RATINGS

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ELECTRICAL CHARACTERISTICS

DAC7811

SBAS337C – APRIL 2005 – REVISED JULY 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or see the TI website at www.ti.com.

Over operating free-air temperature range (unless otherwise noted).

DAC7811

UNIT

–0.3 to +7.0

V

Digital input voltage to GND

V

V

Operating temperature range

–40 to +125

°C

Storage temperature range

–65 to +150

°C

+150

°C

ESD Rating, HBM

2000

V

ESD Rating, CDM

1000

V

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Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

–40

°C to +125°C, unless otherwise noted.

DAC7811

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

STATIC PERFORMANCE

Resolution

12

Bits

Relative accuracy

±1

LSB

Differential nonlinearity

±1

LSB

Output leakage current

±5

nA

Output leakage current

±25

nA

Full-scale gain error

All ones loaded to DAC register

±5

±10

mV

±5

ppm/

°C

Code dependent

5

pF

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Specified by design and characterization; not production tested.

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