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ADC1241 датащи(PDF) 13 Page - National Semiconductor (TI) |
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ADC1241 датащи(HTML) 13 Page - National Semiconductor (TI) |
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13 / 14 page ![]() 40 Dynamic Performance Many applications require the AD converter to digitize ac signals but the standard dc integral and differential nonlin- earity specifications will not accurately predict the AD con- verter’s performance with ac input signals The important specifications for ac applications reflect the converter’s abil- ity to digitize ac signals without significant spectral errors and without adding noise to the digitized signal Dynamic characteristics such as signal-to-noiseadistortion ratio (S(NaD)) effective bits full power bandwidth aperture time and aperture jitter are quantitative measures of the AD converter’s capability An AD converter’s ac performance can be measured using Fast Fourier Transform (FFT) methods A sinusoidal wave- form is applied to the AD converter’s input and the trans- form is then performed on the digitized waveform S(NaD) is calculated from the resulting FFT data and a spectral plot may also be obtained Typical values for S(NaD) are shown in the table of Electrical Characteristics and spectral plots are included in the typical performance curves The AD converter’s noise and distortion levels will change with the frequency of the input signal with more distortion and noise occurring at higher signal frequencies This can be seen in the S(NaD) versus frequency curves These curves will also give an indication of the full power band- width (the frequency at which the S(NaD) drops 3 dB) Two samplehold specifications aperture time and aperture jitter are included in the Dynamic Characteristics table since the ADC1241 has the ability to track and hold the analog input voltage Aperture time is the delay for the AD to respond to the hold command In the case of the ADC1241 the hold command is internally generated When the Auto-Zero function is not being used the hold command occurs at the end of the acquisition window or seven clock periods after the rising edge of the WR The delay between the internally generated hold command and the time that the ADC1241 actually holds the input signal is the aperture time For the ADC1241 this time is typically 100 ns Aper- ture jitter is the change in the aperture time from sample to sample Aperture jitter is useful in determining the maximum slew rate of the input signal for a given accuracy For exam- ple an ADC1241 with 100 ps of aperture jitter operating with a 5V reference can have an effective gain variation of about 1 LSB with an input signal whose slew rate is 12 V ms Power Supply Bypassing TLH10554 – 19 Tantalum Protecting the Analog Inputs TLH10554 – 20 13 |
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