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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32L162VD датащи(PDF) 110 Page - STMicroelectronics |
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STM32L162VD датащи(HTML) 110 Page - STMicroelectronics |
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110 / 115 page  Package information STM32L162VD-X 110/115 DocID027268 Rev 3 Marking of engineering samples The following figure gives an example of topside marking orientation versus ball A1 identifier location. Figure 29. WLCSP104, 0.4 mm pitch wafer level chip scale package top view example 1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and therefore not yet ready to be used in production and any consequences deriving from such usage will not be at ST charge. In no event, ST will be liable for any customer usage of these engineering samples in production. ST Quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity. Table 65. WLCSP104, 0.4 mm pitch recommended PCB design rules Dimension Recommended values Pitch 0.4 Dpad 260 µm max. (circular) 220 µm recommended Dsm 300 µm min. (for 260 µm diameter pad) PCB pad design Non-solder mask defined via underbump allowed. |
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