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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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P80C32EBAA датащи(PDF) 55 Page - NXP Semiconductors |
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P80C32EBAA датащи(HTML) 55 Page - NXP Semiconductors |
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55 / 62 page  Philips Semiconductors Product specification 80C52/80C54/80C58 CMOS single-chip 8-bit microcontrollers 1996 Aug 16 25 VCC P0 EA RST XTAL1 XTAL2 VSS VCC VCC VCC ICC (NC) CLOCK SIGNAL SU00719 Figure 21. ICC Test Condition, Active Mode All other pins are disconnected VCC P0 EA RST XTAL1 XTAL2 VSS VCC VCC ICC (NC) CLOCK SIGNAL SU00720 Figure 22. ICC Test Condition, Idle Mode All other pins are disconnected VCC–0.5 0.45V 0.7VCC 0.2VCC–0.1 tCHCL tCLCL tCLCH tCLCX tCHCX SU00009 Figure 23. Clock Signal Waveform for ICC Tests in Active and Idle Modes tCLCH = tCHCL = 5ns VCC P0 EA RST XTAL1 XTAL2 VSS VCC VCC ICC (NC) SU00016 Figure 24. ICC Test Condition, Power Down Mode All other pins are disconnected. VCC = 2V to 5.5V |
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