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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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P80C32EBAA датащи(PDF) 54 Page - NXP Semiconductors |
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P80C32EBAA датащи(HTML) 54 Page - NXP Semiconductors |
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54 / 62 page  Philips Semiconductors Product specification 80C52/80C54/80C58 CMOS single-chip 8-bit microcontrollers 1996 Aug 16 24 VCC–0.5 0.45V 0.2VCC+0.9 0.2VCC–0.1 NOTE: AC inputs during testing are driven at VCC –0.5 for a logic ‘1’ and 0.45V for a logic ‘0’. Timing measurements are made at VIH min for a logic ‘1’ and VIL max for a logic ‘0’. SU00717 Figure 18. AC Testing Input/Output VLOAD VLOAD+0.1V VLOAD–0.1V VOH–0.1V VOL+0.1V NOTE: TIMING REFERENCE POINTS For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs, and begins to float when a 100mV change from the loaded VOH/VOL level occurs. IOH/IOL ≥ ±20mA. SU00718 Figure 19. Float Waveform SU00768 TYP ACTIVE MODE MAX IDLE MODE TYP IDLE MODE MAX ACTIVE MODE ICCMAX = 0.9 X FREQ. + 1.1 30 25 20 15 10 5 4MHz 8MHz 12MHz 16MHz FREQ AT XTAL1 ICC mA 20MHz 35 24MHz 28MHz 32MHz 36MHz Figure 20. ICC vs. FREQ Valid only within frequency specifications of the device under test |
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