LMV712-N, LMV712-N-Q1

SNOS534I – FEBRUARY 2001 – REVISED JANUARY 2014

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Typical Application Circuit

Figure 1. P.A. Control Loop

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

Human Body Model

1.5kV

Machine Model

150V

Differential Input Voltage

±Supply Voltage

Voltage at Input/Output Pin

−0.4V

6V

(4)

(4)

Current at Input Pin

±10mA

Current at Output Pin

±50mA

Storage Temp Range

−65°C to 150°C

(5)

150°C

Soldering specification for WSON SnPb:

Infrared or Convection (20sec)

235°C

Soldering specification for all other packages:

see product folder at www.ti.com and

http://www.ti.com/lit/SNOA549

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for

availability and specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

(5)

2

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Product Folder Links: LMV712-N LMV712-N-Q1