LMZ12003EXT datasheet(4/29 Pages) TI

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LMZ12003EXT

SNVS663H – JUNE 2010 – REVISED AUGUST 2015

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6.3 Recommended Operating Ratings

MIN

MAX

UNIT

VIN

4.5

6.5

Operation Junction Temperature

−55

125

°C

6.4 Thermal Information

LMZ12003EXT

THERMAL METRIC(1)

NDW

UNIT

7 PINS

4-layer JEDEC Printed-Circuit-Board, 100 vias, No air

19.3

Junction-to-ambient thermal

flow

RθJA

(2)

°C/W

resistance

2-layer JEDEC Printed-Circuit-Board, No air flow

21.5

Junction-to-case (top) thermal

RθJC(top)

No air flow

1.9

°C/W

resistance

(1)

For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application

report, SPRA953.

(2)

RθJA measured on a 1.705-in × 3.0-in 4-layer board, with one ounce copper, thirty five thermal vias, no air flow, and 1-W power

dissipation. Refer to PCB layout diagrams.

6.5 Electrical Characteristics

Limits in standard type are for TJ = 25°C unless otherwise specified. Minimum and Maximum limits are ensured through test,

design or statistical correlation. Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for

reference purposes only. Unless otherwise stated the following conditions apply: VIN = 12 V, VOUT = 1.8 V

PARAMETER

TEST CONDITIONS

MIN(1)

TYP(2)

MAX(1)

UNIT

SYSTEM PARAMETERS

ENABLE CONTROL

VEN

1.18

EN threshold trip point

VEN rising

over the junction temperature

1.1

1.26

(TJ) range of –55°C to +125°C

VEN-HYS

EN threshold hysteresis

VEN falling

SOFT-START

ISS

SS source current

VSS = 0 V

µA

over the junction temperature

4.9

(TJ) range of –55°C to +125°C

ISS-DIS

SS discharge current

–200

µA

CURRENT LIMIT

4.2

DC average

ICL

Current limit threshold

over the junction temperature

VIN= 12 V to 20 V

3.15

5.3

(TJ) range of –55°C to +125°C

ON/OFF TIMER

tON-MIN

ON timer minimum pulse

150

width

tOFF

OFF timer pulse width

260

(1)

Minimum and Maximum limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through

correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Texas Instruments' Average Outgoing Quality

Level (AOQL).

(2)

Typical numbers are at 25°C and represent the most likely parametric normal.

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