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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LMP7731 датащи(PDF) 4 Page - Texas Instruments |
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LMP7731 датащи(HTML) 4 Page - Texas Instruments |
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4 / 26 page  LMP7731 SNOSAT6E – JULY 2007 – REVISED MARCH 2013 www.ti.com 3.3V Electrical Characteristics (1) Unless otherwise specified, all limits are ensured for TA = 25°C, V + = 3.3V, V− = 0V, V CM = V +/2, R L > 10 kΩ to V +/2. Boldface limits apply at the temperature extremes. Parameter Test Conditions Min (2) Typ (3) Max (2) Units ±500 VCM = 2.5V ±6 ±600 Input Offset Voltage VOS μV (4) ±500 VCM = 0.5V ±6 ±600 VCM = 2.5V ±0.5 ±5.5 Input Offset Voltage Temperature TCVOS μV/°C Drift VCM = 0.5V ±0.2 ±5.5 ±30 VCM = 2.5V ±1.5 ±45 IB Input Bias Current nA ±50 VCM = 0.5V ±13 ±77 ±50 VCM = 2.5V ±1 ±70 IOS Input Offset Current nA ±60 VCM = 0.5V ±11 ±80 TCIOS Input Offset Current Drift VCM = 0.5V and VCM = 2.5V 0.048 nA/°C 0.15V ≤ VCM ≤ 0.7V 101 120 0.23V ≤ VCM ≤ 0.7V 89 CMRR Common Mode Rejection Ratio dB 1.5V ≤ VCM ≤ 3.15V 105 130 1.5V ≤ VCM ≤ 3.07V 99 111 2.5V ≤ V+ ≤ 5.0V 129 105 PSRR Power Supply Rejection Ratio dB 1.8V ≤ V+ ≤ 5.5V 117 CMVR Common Mode Voltage Range Large Signal CMRR ≥ 80 dB 0 3.3 V RL = 10 kΩ to V +/2 112 130 VOUT = 0.5V to 2.8V 104 AVOL Open Loop Voltage Gain dB RL = 2 kΩ to V +/2 110 119 VOUT = 0.5V to 2.8V 92 50 RL = 10 kΩ to V +/2 5 75 Output Voltage Swing High 50 RL = 2 kΩ to V +/2 14 75 mV from VOUT either rail 50 RL = 10 kΩ to V +/2 9 75 Output Voltage Swing Low 50 RL = 2 kΩ to V +/2 13 75 Sourcing, VOUT = V+/2 28 45 VIN (diff) = 100 mV 22 IOUT Output Current mA Sinking, VOUT = V+/2 25 48 VIN (diff) = -100 mV 20 2.8 VCM = 2.5V 2.1 3.5 Supply Current IS mA (Per Channel) 3.2 VCM = 0.5V 2.4 4.0 AV = +1, CL = 10 pF, RL = 10 kΩ to SR Slew Rate V+/2, 2.4 V/ μs VOUT = 2 VPP (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute maximum Ratings indicate junction temperature limits beyond which the device maybe permanently degraded, either mechanically or electrically. (2) All limits are specified by testing, statistical analysis or design. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) Ambient production test is performed at 25°C with a variance of ±3°C. 4 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: LMP7731 |
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