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PUSB3TB6 датащи(PDF) 3 Page - NXP Semiconductors |
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PUSB3TB6 датащи(HTML) 3 Page - NXP Semiconductors |
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3 / 13 page ![]() PUSB3TB6 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 1 — 19 August 2014 3 of 13 NXP Semiconductors PUSB3TB6 ESD protection for ultra high-speed interfaces 6. Characteristics [1] This parameter is guaranteed by design. [2] According to IEC 61000-4-5, pulse time tp = 8/20 s. [3] 100 ns Transmission Line Pulse (TLP); 50 ; pulser at 80 ns. Table 5. Characteristics Tamb =25 C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit VBR breakdown voltage II = 1 mA 6 --V ILR reverse leakage current per channel; VI = 3 V - 1 100 nA Cline line capacitance f = 1 MHz; VI =0V [1] - 0.27 0.35 pF C line line capacitance difference f= 1MHz; VI =0V [1] - 0.03 0.05 pF rdyn dynamic resistance surge [2] positive transient - 0.5 - negative transient - 0.5 - TLP [3] positive transient - 0.6 - negative transient - 0.6 - VCL clamping voltage IPP =3.5 A [2] positive transient - 4.8 - V IPP = 3.5 A [2] negative transient - 4.8 - V |
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