ICS841N254BKI REVISION A NOVEMBER 6, 2013

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©2013 Integrated Device Technology, Inc.

ICS841N254BI Data Sheet

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is

mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium

has been reached under these conditions.

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NOTE: Characterized using a 25MHz crystal.

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NOTE 1: Please refer to the phase noise plots.

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NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the output differential

cross points.

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NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.

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NOTE 4: Defined as skew within a bank of outputs at the same voltage and with equal load conditions.

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NOTE 5: Measurement taken from differential waveform.

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NOTE 7: Measurement taken from single ended waveform.

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NOTE 8: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.

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NOTE 9: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.

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NOTE 10: Measured at crossing point where the instantaneous voltage value of the rising edge of Q equals the falling edge of nQ.

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See Parameter Measurement Information Section.

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NOTE 11: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing

points for this measurement. See Parameter Measurement Information Section.

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for any particular system. See Parameter Measurement Information Section.

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NOTE 13: Measured from -150mV to +150mV on the differential waveform (derived from Q minus nQ). The signal must be monotonic through

the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.