 |
поискавой системы для электроныых деталей |
|
|
поискавой системы для электроныых деталей |
|
AN3137 датащи(PDF) 28 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
AN3137 датащи(HTML) 28 Page - STMicroelectronics |
|
|
28 / 42 page  Methods for precision improvement AN3137 28/42 Doc ID 16983 Rev 3 Figure 15. ADC input pin noise spikes from internal charge during sampling process Note that a non-zero external capacitance Cext (parasitic pin capacitance) also exists, so during conversion time the pin capacitance is discharged through source impedance Rin. 4.4.3 Minimizing added errors Workaround for high impedance sources To solve the added error problem, you can increase the sampling time (tS) configuring ADC settings in MCU firmware, so that you discharge the Csh charge through the source impedance Rin. The time constant (Rin * Csh) is the reference for choosing the sampling time. To choose the sampling time cycles, use this formula (see also Section 1): The clock for ADC (fADC) is another important factor; slowing down the ADC clock increases the sampling time. t S f ADC R in C sh ⋅ () In 4096 0.5 ------------- ⋅⋅ ≥ cycles [] |
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Russian ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
