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AN4209 датащи(PDF) 10 Page - STMicroelectronics |
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AN4209 датащи(HTML) 10 Page - STMicroelectronics |
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10 / 19 page ![]() STRVS parameters AN4209 10/19 DocID023949 Rev 2 When tSW is not negligible regarding the thermal of the device (Figure 7), average temperature verification is not enough to ensure that the junction temperature of the die remains within specifications. Consequently, the instantaneous peak junction temperature Tjpeak must be verified using Equation 10 Figure 7. Switching frequency effect on the junction temperature variation in repetitive mode. t Tjpeak Tjavg P(t) Tj(t) tp tSW Ppeak PD t ΔTj tp = pulse width tSW = switching period Tjmax t Tjavg tp PD t Tjmax tSW Ppeak PStep Tjpeak Tj(t) P(t) Δ?Tj tsw << τthermal t sw >> τthermal PStep |
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