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AN2846 датащи(PDF) 30 Page - STMicroelectronics |
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AN2846 датащи(HTML) 30 Page - STMicroelectronics |
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30 / 35 page ![]() Electromagnetic compatibility (EMC) requirements AN2846 30/35 Doc ID 15130 Rev 1 6.2 IEC 61000 4-4 This standard specifies the behavior of the device when subjected to a fast transient burst. The fast transient burst must be applied on all the input pins of the system. A capacitive clamp-coupling device is used as described in the IEC 61000-4-4 standard. The required sustainable burst voltage level is 2.5 kV. The system must continue to operate as intended. No temporary degradation of the performance is acceptable during the test (A criterion). New test methodology has been set up to check the frame integrity against fast transient bursts. The need to monitor each bit level leads to using a scope isolated from the test bench through optic fibers. The generation of /CS and SCK input signals are also isolated through the same way as shown in Figure 39. Current and voltage level adaptation is done through an optical fiber interface (OFI). Long frames history can be stored in the monitoring scope for an easier detection of disrupted bits. The SCLT3-8 immunity has been increased by adding RC filter networks connected on /CS and SCK input pins. But these RC filters act as low pass filters and limit the maxim data transfer speed. For example the filter made of R = 220 Ω, C = 470 pF allows a 1 MHz transmission frequency and ensures device FTB immunity up to 4 kV. The test configuration is shown in Figure 39. Figure 39. Two supplies configuration Table 4. Speed - FTB immunity compromise RC Values SCK speed FTB immunity 220 Ω - 220 pF 2 MHz 3 kV 220 Ω – 470 pF 1 MHz 4 kV Generator Capacitive clamp SCLT3-8 OFI /CS MISO SCK OFI /CS MISO SCK /CS MISO SCK Scope Fiber optic cable FTB generator Bat 1 Bat 2 |
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