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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AN2950 датащи(PDF) 28 Page - STMicroelectronics |
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AN2950 датащи(HTML) 28 Page - STMicroelectronics |
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28 / 37 page  Testing the board AN2950 28/37 Doc ID 15494 Rev 1 2.11 EMI measurements A pre-compliant test to the EN55022 (class B) European norm has been performed using an EMC analyzer and a LISN. First of all, an average measurement of the background noise (board disconnected from the mains) has been performed and is reported in Figure 46. Figure 46. Average measurement of background noise (board disconnected from mains) The average EMC measurements at 115 Vac/full load and 230 Vac/full load have then been performed and the results are shown in Figure 47 and Figure 48 respectively. Table 19. Temperature of key components at 115 VAC full load Point Temperature (in oC) Reference A 66.6 D4 (output diode) B 51.7 VIPer28LN C 65.2 Dz (zener diode) D 38.4 BR1 (Diode bridge) E 38.9 D3 (clamp diode) |
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