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AN4068 датащи(PDF) 40 Page - STMicroelectronics |
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AN4068 датащи(HTML) 40 Page - STMicroelectronics |
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40 / 63 page ![]() Reference design standard tests AN4068 40/63 Doc ID 022923 Rev 2 Figure 29. Conducted emissions: FSK transmission spectrum, quasi-peak measurement, 150 kHz - 30 MHz, line-to-earth Figure 30. Conducted emissions: FSK transmission spectrum, quasi-peak measurement, 150 kHz - 30 MHz, neutral-to-earth 8.3 EMI immunity tests The specific structure of the coupling interface circuit of the application is a weak point against high-voltage disturbances that can come from the external environment. In fact, an efficient coupling circuit with low insertion losses realizes, consequently, a low impedance path from the mains to the power line interface of the device. For this reason it is recommended to add some specific protection on the mains coupling path, to prevent high energy disturbances coming from the mains from damaging the internal power circuitry of the ST7580. |
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