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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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UPD17072 датащи(PDF) 19 Page - NEC |
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UPD17072 датащи(HTML) 19 Page - NEC |
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19 / 226 page  19 µPD17072,17073 1.4 Notes on Using CE Pin The CE pin has a function to set a test mode in which the internal operations of the µPD17073 are tested (dedicated to IC test), in addition to the functions listed in 1.1 Pin Function List. When a voltage higher than VDD is applied to the CE pin, the test mode is set. This means that if noise exceeding VDD is applied to the CE pin even during normal operation, the test mode is set, affecting the normal operation. If the wiring of the CE pin is too long, the above problem occurs because wiring noise is superimposed on the CE pin. Therefore, wire the CE pin with as short a wiring length as possible to suppress noise. If noise cannot be avoided, use external components as shown below to suppress noise. • Connect a diode with low VF between CE and VDD • Connect a capacitor between CE and VDD VDD CE VDD Diode with low VF VDD CE VDD |
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