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28F010 датащи(PDF) 14 Page - Intel Corporation |
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28F010 датащи(HTML) 14 Page - Intel Corporation |
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14 / 30 page ![]() 28F010 ABSOLUTE MAXIMUM RATINGS Operating Temperature During Read 0 Cto a70 C(1) During EraseProgram 0 Cto a70 C(1) Operating Temperature During Read b 40 Cto a85 C(2) During EraseProgram b 40 Cto a85 C(2) Temperature Under Bias b 10 Cto a80 C(1) Temperature Under Bias b 50 Cto a95 C(2) Storage Temperature b 65 Cto a125 C Voltage on Any Pin with Respect to Ground b 20V to a70V(3) Voltage on Pin A9 with Respect to Ground b 20V to a135V(3 4) VPP Supply Voltage with Respect to Ground During EraseProgram b 20V to a140V(3 4) VCC Supply Voltage with Respect to Ground b 20V to a70V(3) Output Short Circuit Current 100 mA(5) NOTICE This is a production data sheet The specifi- cations are subject to change without notice WARNING Stressing the device beyond the ‘‘Absolute Maximum Ratings’’ may cause permanent damage These are stress ratings only Operation beyond the ‘‘Operating Conditions’’ is not recommended and ex- tended exposure beyond the ‘‘Operating Conditions’’ may affect device reliability OPERATING CONDITIONS Symbol Parameter Limits Unit Min Max TA Operating Temperature(1) 070 C TA Operating Temperature(2) b 40 a 85 C VCC VCC Supply Voltage (10%)(6) 450 550 V VCC VCC Supply Voltage (5%)(7) 475 525 V NOTES 1 Operating Temperature is for commercial product as defined by this specification 2 Operating Temperature is for extended temperature products as defined by this specification 3 Minimum DC input voltage is b05V During transitions inputs may undershoot to b20V for periods less than 20 ns Maximum DC voltage on output pins is VCC a 05V which may overshoot to VCC a 20V for periods less than 20 ns 4 Maximum DC voltage on A9 or VPP may overshoot to a140V for periods less than 20 ns 5 Output shorted for no more than one second No more than one output shorted at a time 6 See High Speed AC InputOutput reference Waveforms and High Speed AC Testing Load Circuits for testing characteristics 7 See AC InputOutput reference Waveforms and AC Testing Load Circuits for testing characteristics DC CHARACTERISTICSTTLNMOS COMPATIBLECommercial Products Symbol Parameter Notes Limits Unit Test Conditions Min Typical(4) Max ILI Input Leakage Current 1 g 10 m AVCC e VCC Max VIN e VCC or VSS ILO Output Leakage Current 1 g 10 m AVCC e VCC Max VOUT e VCC or VSS ICCS VCC Standby Current 1 03 10 mA VCC e VCC Max CE e VIH ICC1 VCC Active Read Current 1 10 30 mA VCC e VCC Max CE e VIL f e 6 MHz IOUT e 0mA 14 |
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