HT82K68 datasheet(4/40 Pages) HOLTEK

4 / 40 page

Pin Name I/O ROM Code

Option

Description

PC2~PC3

I/O

Wake-up

Pull-high

or None

Bidirectional 2-bit input/output port. Each bit can be configured

as a wake-up input by ROM code option. Software* instructions

determine the CMOS output or schmitt trigger input with or with-

out pull-high resistor.

PC4~PC7

I/O

Pull-high

or None

Bidirectional 4-bit input/output port. Software* instructions de-

termine the CMOS output or schmitt trigger input with or without

pull-high resistor.

PD0~PD7

I/O

Pull-high

or None

Bidirectional 8-bit input/output port. Software* instructions de-

termine the CMOS output or schmitt trigger input with or without

pull-high resistor.

PE0~PE1

I/O

Pull-high

or None

Bidirectional input/output port. Software* instructions determine

the CMOS output or schmitt trigger input with or without

pull-high resistor.

PE2~PE4

This pin is an NMOS output structure. The pad can function as

LED drivers for the keyboard. IOL=14mA, @VOL=3.2V

VDD

¾¾

Positive power supply

VSS

¾¾

Negative power supply, ground

RESET

Chip reset input. Active low. Built-in power-on reset circuit to re-

set the entire chip. Chip can also be externally reset via RESET

OSC1

OSC2

Crystal or

OSC1, OSC2 are connected to an RC network or a crystal for the

internal system clock. In the case of RC operation, OSC2 is the

output terminal for the 1/4 system clock; A 110kW resistor is con-

nected to OSC1 to generate a 2MHZ frequency.

Note: *: Software means the ROM code option can be configured by HT-IDE (Holtek Integrated De-

velopment Environment).

Absolute Maximum Ratings

Supply Voltage .............................-0.3V to 5.5V

Storage Temperature ................-50°Cto125°C

Input Voltage ................VSS-0.3V to VDD+0.3V

Operating Temperature .............-25°Cto70°C

Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maxi-

mum Ratings² may cause substantial damage to the device. Functional operation of this device

at other conditions beyond those listed in the specification is not implied and prolonged expo-

sure to extreme conditions may affect device reliability.

HT82K68E

August 8, 2000

Preliminary

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