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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32L152C6 датащи(PDF) 81 Page - STMicroelectronics |
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STM32L152C6 датащи(HTML) 81 Page - STMicroelectronics |
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81 / 131 page  DocID17659 Rev 9 81/131 STM32L151x6/8/B, STM32L152x6/8/B Electrical characteristics 105 Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error, out of spec current injection on adjacent pins or other functional failure (for example reset, oscillator frequency deviation, LCD levels, etc.). The test results are given in Table 41. Note: It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative currents. Table 41. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on all 5 V tolerant (FT) pins -5 +0 mA Injected current on any other pin -5 +5 |
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