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AS8650B датащи(PDF) 16 Page - ams AG |
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AS8650B датащи(HTML) 16 Page - ams AG |
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16 / 47 page ![]() www.ams.com/AS8650 Revision 1.1 15 - 46 AS8650B Datasheet - Electrical Character i s t ics Characteristics of the SDA and SCLK Bus Lines for F/S Mode I²C Bus. 1. All values referred to VIHmin and VIlmax levels (see Table 14). 2. A fast mode I²C bus device can be used in Standard mode I²C bus system, but the requirement tSU_DAT ≥ 250ns must then be met. This will automatically be the case if the device do not stretch the low period of the SCLK signal. If such a device does stretch the low period of the SCLK signal, it must output the next data bit to the SDA line trmax. TSU_DAT = 1000 + 250 = 1250ns (according to standard mode I²C bus specification) before the SCLK line released. 3. The maximum tHD;DAT has only to be met if the device does not stretch the low period (tLOW) of the SCLK signal. 4. Cb = total capacitance of one bus line in pF. If mixed with Hs-mode devices, faster fall-times according to Table 14 allowed. 5. This device internally provides a hold time of at least 300ns for the SDA signal to bridge the undefined region of the falling edge of the SCLK. Table 15. I²C Timing Parameters Symbol Parameter Standard Fast Units Min Max Min Max (see Footnote 1) fSCLK SCLK clock frequency 0 100 0 400 kHz tHD_STA Hold time (repeated) START condition. After this period, the first clock pulse is generated 4- 0.6 - µs tLOW Low period of the SCLK clock 4.7 - 1.3 - µ s tHIGH High period of the SCLK clock 4.0 - 0.6 - µ s tSU_STA Set-up time for a repeated START condition 4.7 - 0.6 - µ s tSU_DAT Data set-up time 250 - 100 (see Footnote 2) -ns tHD_DAT Data hold-time 0 (see Footnote 5) 3450 (see Footnote 3) 0 (see Footnote 5) 900 (see Footnote 3) ns tr Rise time of SDA and SCLK signals - 1000 20+ 0.1Cb (see Footnote 4) 300 ns tf Fall time of SDA and SCLK signals - 300 20+ 0.1Cb (see Footnote 4) 300 ns tSU_STO Set-up time for STOP condition 4.0 - 0.6 - µ s tBUF Bus free time between a STOP and START condition 4.7 - 1.3 - µ s Cb Capacitive load for each bus line - 400 - 400 pF VnL Noise margin at the Low level for each connected device (including hysteresis) 0.1V*LDO1 - 0.1V*LDO1 - VnH Noise margin at the High level for each connected device (including hysteresis) 0.2V*LDO1 - 0.2V*LDO1 - |
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